Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors

Emmanuel Fokitis,Theodoros Geralis,Stavros Maltezos,Nikolaos Vodinas
DOI: https://doi.org/10.48550/arXiv.2008.11425
2020-08-26
Abstract:A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray tube, were at the range 200 - 400 MHz, while an uncertainty in the flux of the order of 5% has been estimated. We also applied this calibration for radiation hardness study of a multichannel silicon microstrip X-Ray detector.
Instrumentation and Detectors
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