Abstract:Novel schemes for generating ultra-low emittance electron beams have been developed in the last years and promise compact particle sources with excellent beam quality suitable for future high-energy physics experiments and free-electron lasers. Current methods for the characterization of low emittance electron beams such as pepperpot measurements or beam focus scanning are limited in their capability to resolve emittances in the sub $0.1$ mm mrad regime. Here we propose a novel, highly sensitive method for the single shot characterization of the beam waist and emittance using interfering laser beams. In this scheme, two laser pulses are focused under an angle creating a grating-like interference pattern. When the electron beam interacts with the structured laser field, the phase space of the electron beam becomes modulated by the laser ponderomotive force and results in a modulated beam profile after further electron beam phase advance, which allows for the characterization of ultra-low emittance beams. 2D PIC simulations show the effectiveness of the technique for normalized emittances in the range of $\epsilon_n=[0.01,1]$ mm mrad.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is how to accurately measure the characteristics of ultra - low emittance electron beams, especially for those electron beams with very small source sizes and emittances in the micrometer - milliradian (µm mrad) range. Current methods such as pepper - pot measurement or beam - focus scanning have limitations in resolving emittances below 0.1 mm mrad. This paper proposes a new, highly sensitive single - shot measurement method to characterize the beam waist and emittance by using an interfering laser beam. Specifically, this method uses two laser pulses intersecting at a certain angle to form a grating - like interference pattern. When the electron beam interacts with this structured laser field, the phase space of the electron beam will be modulated by the ponderomotive force of the laser, resulting in the modulation of the beam profile. This modulation can be used to characterize ultra - low emittance electron beams. Two - dimensional particle - in - cell (2D PIC) simulations show the effectiveness of this technique for normalized emittances in the range of \[ \epsilon_n = [0.01, 1] \text{ mm mrad} \]. This method can not only measure very small electron beam waists (as low as tens of nanometers), but also provide unprecedented emittance accuracy, and is suitable for GeV - level electron beams. In addition, this method can also be adapted to electron beams with significant energy spreads, such as electron beams from plasma wake - field accelerators. This can be achieved by combining beam modulation in one plane and magnetic dispersion of the electron beam in another plane. Simulation results show that for polychromatic electron beams with an energy spread of less than 5%, this method does not cause a significant change in the peak height, which is consistent with the sensitivity of the modulation depth to deviations from the optimal intensity.

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