Abstract:A new way in electron beam emittance measurement with Cerenkov radiation "double imaging" method is proposed in this paper. In the standard emittance measurements with optical diagnostics such as Cerenkov radiation, OTR (Optical Transition Radiation), fluorescence screen or BMP (beam profile monitor) etc., the emittance is indirectly calculated through quadrupole-scanning technique, with the prior ssumption that the beam phase space density distribution is ellipse, which will certainly induce systematic error when the beam profile is quite irregular or the space-charge effects can not be omitted. In proposed method, the Cerenkov radiation pass through a 1-meter focal-length thin convex lens, and a CCD camera is used to capture two images of Cerenkov radiation at the focal plane and at the image plane of the lens respectively. Then, with image processing technique, we acquire the angular divergence information of the electron beam from the image of the focal plane and the radial distribution information from the image of the image plane, which we call Cerenkov radiation "double imaging" method. Therefore, the emittance can be directly attained according to the definition of the RMS emittance. By this method, we can measure the actual phase space distributions without making any prior assumptions about the density distributions. Compared with other general measurements, this "double imaging" method has advantages of simpler equipment, higher precision and wider application. This paper also presents the computer simulation results of emittance measurement on the DC-SC ( DC-Superconducting) photocathode injector of PKU-SCAF (Peking University Superconducting Accelerator Facility) being built at Peking University.

Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance

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Characterizing ultra-low emittance electron beams using structured light fields

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Ultrafast Relativistic Electron Nanoprobes

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