Abstract:The exploration of zinc oxide (ZnO) has seen rapid growth due to its wide bandgap, high thermal conductivity, and high electron mobility within its nanostructures, making it highly valuable for applications in electronic and optical devices. This study involves the deposition of ZnO nanostructures onto a quartz substrate using the thermal evaporation deposition technique. The research delves into the influence of various annealing environments on morphology and electronic/atomic structures. X-ray Diffraction (XRD) analysis reveals the development of the ZnO phase with a preferred orientation when annealed in a mixture of hydrogen and argon gases. It was observed that the films do not transform into complete ZnO for the as-prepared and for lower temperatures (< 400 °C). Annealing at lower temperatures or room temperature retains the metallic Zn. When subjected to higher annealing temperatures in the presence of oxygen and ambient conditions, formation of ZnO hexagonal wurtzite structures was evident. A wide variation in the morphology was observed for films annealed in different annealing environments, from petal-like structures to rods. Both the band edge and defect emissions using photoluminescence were observed to vary with varying annealing conditions. In-situ XANES uncovers the reduction of Zn and metallic nature noticed in the as-prepared sample and argon annealing at 400 °C. A higher charge transfer by Zn with a prominent delocalization of Zn 4p state was observed in oxygen annealing environment at 400 °C with an enhanced coordination of Zn–O and Zn–Zn. These distinct photoluminescence emissions from the films were correlated to the electronic structure and local atomic structure. Further, this investigation provides a path to develop next-generation optoelectronic devices.

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