Abstract:High-speed testing of digital transmission necessitates a functional test, which is typically the test performed by automatic test equipment (ATE) on military and avionics units under test (UUTs). Older military ATEs, and indeed most modern day ATEs, are not equipped with test instruments for high-speed data transmission. Typically, such high-speed test instruments are designed for signal characterizations in design verification tests, which require human interpretations. The primary purpose of military ATE is to allow non-technical soldiers or sailors to comprehensively test and diagnose all types of electronics and to derive very specific repair instructions. We introduce synthetic instruments (SIs) and show how they offer a feasible option for traditional ATEs while they are also able to test high-speed unit under test (UUT) signals. Rather than replace military ATEs, the high-speed SI solution can be integrated into existing ATEs, even legacy ATEs. The clear benefit of this approach is the extension of ATE useful life and the capability to test present and even future circuit types. It also improves the performance of military ATEs by allowing them to test multi-Gbps signals. High-speed I/O, such as the USB 3.0 that operates at 5 Gbps is discussed. (Although USB 3.0 was recently renamed as USB 3.2 Gen 1, for consistency in this article, we use the traditional term USB 3.0.) The example utilizes a special-purpose USB 3.0 SI that responds to commands in the test program set (TPS) developed by test engineers. The same USB 3.0 SI, including the test commands, can then be reused on other ATEs and UUTs with the same bus. This can be an industry-wide game changer when SIs are developed for other I/O buses and applications. Utilizing SIs reduces TPS development costs and ATE expenditures, while improving TPS development times and effort.

AT-SPEED TEST IS NOT NECESSARILY AN AC TEST

Improved Static Testing of A/D Converters for DC Measurements

High-speed I/O capabilities added to military automatic test equipment (ATE) using synthetic instruments

Analyse of Protection Devices' Speed Performance against ESD under CDM Using TCAD

ADC test methods using an impure stimulus: A survey

Survey of AC Drive Test System Research

Testing development for ADC on automatic test system

An Integrated Testbed with Single DC Source for Delivering Symmetrical Square-Wave Excitation Voltage in the Triple Pulse Test.

Combinational automatic test pattern generation for acyclic sequential circuits

Effective ADC linearity testing using sinewaves

Internet Speed Measurement: Current Challenges and Future Recommendations

A Fast Technique to Evaluate Uniformity Conformity to Standards' Requirement for a Reverberation Chamber at the Low End of Test Frequency

A Comparative Analysis of Ookla Speedtest and Measurement Labs Network Diagnostic Test (NDT7)

Multi-frequency Test for analog circuits

Experimental Comparison of Different Standards for Dynamic Characterization of ADCs

A High-Accuracy, High-Speed Dynamic Performance Test Method for Heterodyne Interferometry Measurement Electronics

Automatic test packet generation

Generator of Test Traffic in the Network Tester at 10gbps Rate

Design of Mixed-Signal Circuit for Testability

Test generation for cyclic combinational circuits

Non-scan testability based on fault-oriented conflict analysis