Abstract:In this work, a simple, cost-effective successive ionic layer adsorption and reaction (SILAR) deposition technique has been used to deposit a high-quality tin selenide (SnSe) thin film onto a glass substrate. Structural, morphologic, and thermoelectric properties have been characterized for the prepared thin film. X-ray diffraction (XRD) results of the SnSe thin film reveal an orthorhombic structure phase. The morphological properties of the prepared thin films have been studied using field emission scanning electron microscopy (FESEM). The stoichiometric composition of the deposited thin film and the elemental binding energies of the Sn and Se elements have been investigated with energy-dispersive spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS). The Fourier transformation infrared (FTIR) spectrum of the SnSe thin film displays vibrational modes of chalcogenides bonds. These results suggest that the developed thin film is crystalline, uniform, and without impurities and is appropriate for energy harvesting applications. The prepared thin film's Seebeck coefficient and electrical resistivity were estimated through ZEM-3 from room temperature to 600 K. The power factor was evaluated. A substantially high electrical conductivity is observed, which decreases somewhat with temperature, suggesting a semimetal conducting transport—the absolute values of the Seebeck coefficient increase with temperature. The resulting power factor showed the highest values near room temperature and a somewhat decreasing trend as the temperature increased. Despite lower values of the Seebeck coefficient, the substantially enhanced power factor is due to the higher electrical conductivity of the thin film, superior to that reported previously. This precursor study demonstrates promising results for developing high-performance flexible thermoelectric devices via a simple and facile SILAR strategy.

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