Cálculo de constantes ópticas de peliculas delgadas de Silicio compensado a través del método de Swanepoel

W. A. Rojas C.,M. Chaparro P.,L. M. Pardo C.,M. I. Cruz F.
DOI: https://doi.org/10.48550/arXiv.1908.00359
2019-07-30
Abstract:Characterization and determination of the optical constants for thin film silicon compensated through the transmittance spectrum is presented. Such properties were determined by R. Swanepoel model. Comparison between the refractive indices of pure silicon and silicon compensated. Increasing refractive index behavior at low wavelengths in both plots was observed. The difference lies in the concentration and type of element that has been added to the thin film. The behavior of the dielectric constant was studied, their relationship with the refractive index. It is found that the value of the dielectric constant to a thin film of silicon compensated agree with those reported in the literature. The reported value of the gap for pure silicon corresponds to $ 1.11eV $ and the value of the gap for the sample corresponds to $ 0.7275eV $, the discrepancy is due to the level of concentration in the compensated silicon film.
Materials Science
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to determine the optical constants of compensated silicon films by the Swanepoel method. Specifically, the research aims to: 1. **Characterize and determine the optical properties of compensated silicon films**: Use transmission spectra to measure optical properties such as the refractive index, thickness, absorption coefficient, extinction coefficient, and optical band - gap (gap) of the films. 2. **Compare the refractive indices of pure silicon and compensated silicon**: Observe the refractive index behavior of both at low wavelengths and analyze the reasons for the differences, which mainly lie in the elements added to the films and their concentrations. 3. **Study the behavior of the dielectric constant and its relationship with the refractive index**: Verify whether the experimentally measured dielectric constant values are consistent with those reported in the literature. 4. **Determine the band - gap**: By analyzing the relationship between the absorption coefficient and energy, determine the band - gap of the compensated silicon films and explore the reasons for the differences from the band - gap of pure silicon. Through these studies, the paper hopes to provide a reliable method for evaluating and understanding the optical characteristics of compensated silicon films, which is of great significance for the application of semiconductor materials in the optoelectronic field.