Abstract:A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring constant is known. Recent work has demonstrated that the measured spring constant of a cantilever can vary up to a factor of two, even for the exact same cantilever measured by different users on different microscopes. Here we demonstrate that a standard method for calibrating the spring constant (using the oscillations due to thermal energy) is susceptible to ambient noise, which can alter the result significantly. We demonstrate a new step-by-step method to measure the spring constant by actively driving the cantilever to measure the resonance frequency and quality factor, giving results that are unaffected by acoustic noise. Our method can be performed rapidly on any atomic force microscope without any expensive additional hardware.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: **Eliminating the influence of environmental acoustic noise on the calibration of the cantilever spring constant in atomic force microscopy (AFM)**. ### Problem Background Atomic force microscopy (AFM) is widely used to quantify local forces through the interaction between the probe tip and the sample surface. The accuracy of these measurements depends on the precise determination of the cantilever spring constant. However, when different users measure the same cantilever on different microscopes, the measured spring constants may vary significantly, even by a factor of 2. An important reason for this difference is the influence of environmental noise (such as acoustic noise) on the calibration of the cantilever spring constant using the traditional thermal fluctuation method. ### Limitations of Traditional Methods Traditional cantilever spring constant calibration methods (such as the Sader method) usually rely on measuring the oscillations caused by the thermal fluctuations of the cantilever. This method assumes that thermal fluctuations are the only factor driving the cantilever vibration. In fact, other noise sources such as acoustic noise in the environment may also affect the vibration characteristics of the cantilever, leading to deviations in the measurement results. ### New Method Proposed in the Paper To solve this problem, the paper proposes a new actively - driven method to measure the resonance frequency and quality factor of the cantilever. The specific steps are as follows: 1. **Actively drive the cantilever**: By applying a sinusoidal drive signal, scan the resonance frequency of the cantilever. 2. **Measure the resonance frequency**: By fitting the response curve, accurately measure the resonance frequency of the cantilever. 3. **Measure the quality factor**: By recording and fitting the attenuation process (i.e., "ringdown") of the cantilever at the resonance frequency, calculate the quality factor. 4. **Calculate the spring constant**: Use the formula \(\text{k}_n = 0.1906 \rho b^2 L Q \Gamma_i(\omega_0) \omega_0^2\) to calculate the spring constant of the cantilever. ### Experimental Results The experimental results show that the new method can effectively eliminate the influence of environmental acoustic noise on the measurement of the cantilever spring constant and provide more reliable and consistent results. For cantilevers in the audio range (about 20 kHz), the influence of environmental acoustic noise is particularly obvious; for cantilevers in the ultrasonic frequency band (about 80 kHz), although the influence is smaller, it still exists. Through the actively - driven method, it can be ensured that the measurement results are not interfered by environmental acoustic noise. ### Conclusion The actively - driven method proposed in the paper provides a new solution for the precise calibration of the cantilever spring constant, which can be quickly implemented on any AFM system without additional expensive hardware. This helps to improve the accuracy and consistency of AFM measurements and reduce the systematic errors caused by environmental noise.

Eliminating the effect of acoustic noise on cantilever spring constant calibration

Calibration of the Effective Spring Constant of Ultra-Short Cantilevers for A High-Speed Atomic Force Microscope

Accurate flexural spring constant calibration of colloid probe cantilevers using scanning laser Doppler vibrometry

Calibration of the Spring Constant of AFM Cantilever

Calibrate the Non-Orthogonal Error of AFM with Two-Dimensional Self-Traceable Grating.

Improved Sensitivity for Subsurface Imaging by Contact Resonance Atomic Force Microscopy Using Fano Peaks

Calibration of oscillation amplitude in Dynamic Scanning Force Microscopy

Atomic force microscopy calibration of standing surface acoustic wave amplitudes

Improved Calibration System of Micro-Cantilever Spring Constant

Comparison and Analysis of Different Methods in Calibration of the Spring Constant of AFM Cantilever Probes

Calibration of the spring constant of AFM micro-cantilever based on bending method

"Noiseless" thermal noise measurement of atomic force microscopy cantilevers

Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire

High-resolution measurement of atomic force microscope cantilever resonance frequency

Research Progress on the Calibration Methods for Elastic Constant of Atomic Force Microscopy Cantilevers

Thermal noise calibration of functionalized cantilevers for force microscopy: effects of the colloidal probe position

A virtual instrument to standardise the calibration of atomic force microscope cantilevers

Large colloidal probes for atomic force microscopy: Fabrication and calibration issues

Dimensions and spring constants of rectangular AFM cantilevers determined from resonance measurements

Hydrodynamic function and spring constant calibration of FluidFM micropipette cantilevers

Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid