Main Magnetic Focus Ion Source: II. The first investigations at 10 keV

V. P. Ovsyannikov,A. V. Nefiodov
DOI: https://doi.org/10.48550/arXiv.1506.00127
2015-05-30
Plasma Physics
Abstract:The basic principles of design for the compact ion source of new generation are presented. The device uses the local ion trap created by the axial electron beam rippled in a thick magnetic lens. In accordance with this feature, the ion source is given the name main magnetic focus ion source. The experimental evidences for the production of Ir$^{59+}$, Xe$^{44+}$, and Ar$^{16+}$ ions are obtained. The control over depth of the local ion trap is shown to be feasible.
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