Investigation of Charge Plasma based Nanowire Field Effect Transistor for Sub 5 nm

P. Naveen ChanderP. RajaS. Ashok kumarR. Gayathri1 Department of ECE,Sri Manakula Vinayagar Engineering College,Puducherry,India2 Department of ECE,Karpagam Academy of Higher Education,Coimbatore,IndiaP Naveen Chander is doing his BTechdegree in the stream of Department ofElectronics and Communication Engineering,Sri Manakula Vinayagar EngineeringCollege,Puducherry India. Hisresearch interests include nanoelectronics,microelectronics,simulation and modeling. E-mail: Raja received his PhD degree fromPondicherry University,India and masterof technology from Indian Instituteof Technology,Madras India. He iscurrently working as professor& headin the in the department of electronicsand communication engineering,SriManakula Vinayagar Engineering College,Puducherry,India. His research areas involve wireless communication,VLSI,and image processing. E-mail: rajashruthy@gmail.comS Ashok kumar received his PhD degreein electronics and communication engineeringfrom Kalasalingam University,India. He is currently working as an associateprofessor in the Department of Electronicsand Communication Engineering,Karpagam Academy of Higher Education,India. His research interests include nanoelectronics,microelectronics,simulation and modeling.R Gayathri received her ME degree inapplied electronics from SathyabamaUniversity,Chennai,India. She is currentlyworking as an assistant professorin the Department of Electronics andCommunication Engineering,Sri ManakulaVinayagar Engineering College,Puducherry,India. Her research interestsinclude signal and image processing,VLSI and spectralanalysis. E-mail: gayathridevee@gmail.com
DOI: https://doi.org/10.1080/03772063.2024.2309227
IF: 1.8768
2024-02-09
IETE Journal of Research
Abstract:In the proposed work, cylindrical Nanowire Field Effect Transistors (NWFETs) are created for sub-10 nm applications using the charge plasma (CP) principle. In the middle of the transistor, a gate is surrounded by an oxide layer and a channel layer. By enclosing the channel in an oxide layer and surrounding it with a distinctive metal layer with various work functions, the charge-plasma concept is introduced. A detailed discussion of device characteristics, such as electric potential and transfer qualities, are presented. For channel lengths of 35 and 10 nm, measurements of the threshold voltage, drain current, and I ON /I OFF ratio are analyzed. Sentaurus Technology Computer Aided Design (TCAD) is used to evaluate and analyze the device. TCAD simulations that incorporate the Lombardi mobility model, Shockley-Read-Hall (SRH) model, Density-Gradient model, and Auger recombination models make it easier to calculate tunneling and recombination. Interestingly, the CP-based NWFET produces twice as much output current as its traditional NWFET. Because of the Schottky junction's larger vertical field, significant improvements include the reduction of lateral coupling between the source and drain field lines, the stabilization of the I ON /I OFF ratio, an overall reduction in parasitic leakage, and improved scalability. This work extends to circuit implementation, featuring the development of an Inverter circuit. Performance assessments are conducted, and comparisons are drawn with varying channel lengths and widths, further substantiating the efficacy of the proposed structure.
telecommunications,engineering, electrical & electronic
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