Radiation tolerance of FPCCD vertex detector for the ILC

Shunsuke Murai,Akimasa Ishikawa,Tomoyuki Sanuki,Akiya Miyamoto,Yasuhiro Sugimoto,Hisao Sato,Hirokazu Ikeda,Hitoshi Yamamoto
DOI: https://doi.org/10.48550/arXiv.1703.05603
2017-03-16
Abstract:The Fine Pixel CCD (FPCCD) is one of the candidate sensor technologies for the ILC vertex detector. The vertex detector is located near the interaction point, thus high radiation tolerance is required. Charge transfer efficiency of CCD is degraded by radiation damage which makes traps in pixels. We measured charge transfer inefficiency (CTI) of a neutron irradiated FPCCD prototype. We observed a degradation of CTI compared with non-irradiated CCD. To improve the CTI of irradiated CCD, we performed the fat-zero charge injection to fill the traps. In this paper, we report a status of CTI improvement.
Instrumentation and Detectors,High Energy Physics - Experiment
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