Abstract:Strain engineering offers unique control to manipulate the electronic band structure of two-dimensional materials (2DMs) resulting in an effective and continuous tuning of the physical properties. Ad-hoc straining 2D materials has demonstrated novel devices including efficient photodetectors at telecommunication frequencies, enhanced-mobility transistors, and on-chip single photon source, for example. However, in order to gain insights into the underlying mechanism required to enhance the performance of the next-generation devices with strain(op)tronics, it is imperative to understand the nano- and microscopic properties as a function of a strong non-homogeneous strain. Here, we study the strain-induced variation of local conductivity of a few-layer transition-metal-dichalcogenide using a conductive atomic force microscopy. We report a novel strain characterization technique by capturing the electrical conductivity variations induced by local strain originating from surface topography at the nanoscale, which allows overcoming limitations of existing optical spectroscopy techniques. We show that the conductivity variations parallel the strain deviations across the geometry predicted by molecular dynamics simulation. These results substantiate a variation of the effective mass and surface charge density by .026 me/% and .03e/% of uniaxial strain, respectively. Furthermore, we show and quantify how a gradual reduction of the conduction band minima as a function of tensile strain explains the observed reduced effective Schottky barrier height. Such spatially-textured electronic behavior via surface topography induced strain variations in atomistic-layered materials at the nanoscale opens up new opportunities to control fundamental material properties and offers a myriad of design and functional device possibilities for electronics, nanophotonics, flextronics, or smart cloths.

Effect of strain, thickness, and local surface environment on electron transport properties of oxygen-terminated copper thin films

Electron transport properties of sub-3-nm diameter copper nanowires

Anomalous strain rate sensitivity of a Cu/Al$_2$O$_3$ multi-layered thin film

Effects of nanoscale surface roughness on the resistivity of ultrathin epitaxial copper films

The effect of substrate temperature and oxygen partial pressure on the properties of nanocrystalline copper oxide thin films grown by pulsed laser deposition

Enhanced Electron Transport in Thin Copper Films via Atomic-Layer Materials Capping

Oxidation Kinetics of Nanoscale Copper Thin Films at Low Temperature Characterized by Sheet Resistance and Optical Transmittance

Electron Transport in Graphene-Versus Al/Pd-Coated Thin Cu Films with Low-Surface Roughness: A First Principles Study.

Strain Induced Modulation of Local Transport of 2D Materials at the Nanoscale

The Electrical and Mechanical Behaviors of Copper Thin Films Deposited on Polyethylene Terephthalate Under Tensile Stress

Origin Of The Thickness-Dependent Oxidation Of Ultrathin Cu Films On Au(111)

Grain and grain boundary conduction channels in copper iodide thin films

Effect of oxidation on mechanical properties of copper nanowire: A ReaxFF (reactive force field) molecular dynamics study

Constrained Diffusional Creep in UHV-produced Copper Thin Films

Strain-Driven Oxygen Deficiency in Multiferroic Srmno3 Thin Films

Tuning oxygen vacancy diffusion through strain in SrTiO$_3$ thin films

Processing and Specimen Thickness to Grain Size (t/d) Ratio Effects on Tensile Behaviour and Microformability of Copper Foils

Influences of Film Thickness on the Structural, Electrical and Optical Properties of CuAlO2 Thin Films

Identification of an Actual Strain-Induced Effect on Fast Ion Conduction in a Thin-Film Electrolyte

Thickness and microstructure effects in the optical and electrical properties of silver thin films

Size Effect on Mechanical Properties and Texture of Pure Copper Foil by Cold Rolling