Real-time Measurement of Stress and Damage Evolution During Initial Lithiation of Crystalline Silicon

Michael J. Chon,Vijay A. Sethuraman,Anthony McCormick,Venkat Srinivasan,Pradeep Guduru
DOI: https://doi.org/10.1149/ma2011-02/17/1336
2011-08-01
ECS Meeting Abstracts
Abstract:Abstract not Available.
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