Line Defects in Molybdenum Disulfide Layers

Andrey N. Enyashin,Maya Bar-Sadan,Lothar Houben,Gotthard Seifert
DOI: https://doi.org/10.1021/jp403976d
2013-04-13
Abstract:Layered molecular materials and especially MoS2 are already accepted as promising candidates for nanoelectronics. In contrast to the bulk material, the observed electron mobility in single-layer MoS2 is unexpectedly low. Here we reveal the occurrence of intrinsic defects in MoS2 layers, known as inversion domains, where the layer changes its direction through a line defect. The line defects are observed experimentally by atomic resolution TEM. The structures were modeled and the stability and electronic properties of the defects were calculated using quantum-mechanical calculations based on the Density-Functional Tight-Binding method. The results of these calculations indicate the occurrence of new states within the band gap of the semiconducting MoS2. The most stable non-stoichiometric defect structures are observed experimentally, one of which contains metallic Mo-Mo bonds and another one bridging S atoms.
Materials Science
What problem does this paper attempt to address?
The problem that this paper attempts to solve is the reason for the abnormally low electron mobility in monolayer molybdenum disulfide (MoS₂). Specifically, through experimental observations and theoretical calculations, the authors revealed the inherent defects in monolayer MoS₂, namely inversion domain boundaries. These defects cause changes in the electronic structure of the material, thereby affecting the transport properties of charge carriers. The paper points out that these line defects can be observed under high - resolution transmission electron microscopy (HRTEM) at atomic resolution, and through quantum - mechanical calculations based on the Density - Functional Tight - Binding (DFTB) method, the stability and electronic properties of these defects were studied. The calculation results show that these defects will lead to the emergence of new energy states within the band gap of the semiconductor MoS₂, which may be an important factor affecting the electronic properties of MoS₂ - based nano - electronic devices.