Abstract:The impact of Ti doping of VO2 thin films on (110) rutile TiO2 substrates was studied by Raman spectroscopy. The scattering geometry of the Raman experiment defines the relationships between the experimental Cartesian coordinate system and the Cartesian coordinate systems of the unit cell of the rutile TiO2 substrate and those of the two types of domains in the M1‐VO2 film below the phase transition. Vanadium dioxide (VO2) undergoes a reversible first‐order metal‐to‐insulator transition (MIT) from a high‐temperature metallic phase to a low‐temperature insulating phase at a critical temperature Tc of 68°C. The MIT is accompanied by a structural phase transition. In addition to the metallic high‐temperature rutile phase, several insulating phases may be involved depending on doping, interfacial stress, or external stimuli. Unambiguously identifying the crystal phases involved in the phase transition is of key interest from the point of view of application as well as fundamental science. We study the impact of Ti doping of VO2 thin films on (110) rutile TiO2 substrates. We conduct a careful analysis of structural properties by combining results of x‐ray diffraction, Raman spectroscopy, and transmission electron microscopy. The transition temperature Tc of the deposited thin films decreases with increasing Ti‐content. All our thin film samples undergo a structural phase transition from the monoclinic M1‐phase to the rutile R‐phase with increasing temperature without passing the intermediate monoclinic M2‐phase. A careful analysis of polarization and angle‐dependent Raman data reveals that, above Tc, the unit cell of the high‐temperature rutile TixV1‐xO2 phase is aligned with that of the rutile TiO2 substrate whereas, below Tc, 180°‐domains of the M1‐phase of TixV1‐xO2 are observed. The structural relationship between TiO2 substrate and the high respective low‐temperature phase of the TixV1‐xO2 determined by Raman spectroscopy is in excellent agreement with TEM results on these samples. Raman spectroscopy is a powerful tool for studying structural changes of VO2‐based samples in the vicinity of MIT.

Substrate Effect on Optical Properties of Insulator-Metal Transition in VO2 Thin Films

Optical properties of VO$_2$ films at the phase transition: influence of substrate and electronic correlations

Intrinsic optical properties of vanadium dioxide near the insulator-metal transition.

Synthesis of Vanadium Dioxide Thin Films on Conducting Oxides and Metal–insulator Transition Characteristics

Insulator–metal transition in substrate-independent VO2 thin film for phase-change devices

On the Optical Properties of Thin‐Film Vanadium Dioxide from the Visible to the Far Infrared

Infrared spectroscopy and nano-imaging of the insulator-to-metal transition in vanadium dioxide

Current-modulated Optical Properties of Vanadium Dioxide Thin Films in the Phase Transition Region

Effects of crystal orientation on electronic band structure and anomalous shift of higher critical point in VO2 thin films during the phase transition process

Raman scattering of TixV1‐xO2 thin films on (110) rutile TiO2 in the low and high temperature phase adjacent to the metal–insulator transition

Polarized Raman mapping and phase-transition by CW excitation for fast purely optical characterization of VO2 thin films

Optically Monitored Electric-Field-Induced Phase Transition in Vanadium Dioxide Crystal Film

Electrodynamics of the vanadium oxides VO2 and V2O3

Effect of heating/cooling dynamics in the hysteresis loop and tunable IR emissivity of VO2 thin films.

Strong substrate influence on atomic structure and properties of epitaxial VO2 thin films

Optical Forces on an Oscillating Dipole Near VO2 Phase Transition

Comprehensive Study of the Metal-Insulator Transition in Pulsed Laser Deposited Epitaxial VO2 Thin Films

Thermal-stimulated Phase Transition of Vanadium Dioxide Enabling Versatile Transduction and Smart Applications

Ultraviolet-Infrared Dielectric Functions And Electronic Band Structures Of Monoclinic Vo2 Nanocrystalline Film: Temperature-Dependent Spectral Transmittance

Effect of structural disorder on the modification of V–V and V–O bond lengths at the metal-dielectric phase transition in VO 2 thin films

Preparation and Optical Properties of Phase-Change VO 2 Thin Films