Direct measurements of band gap grading in polycrystalline CIGS solar cells

M. P. Heinrich,Z-H. Zhang,Y. Zhang,O. Kiowski,M. Powalla,U. Lemmer,A. Slobodskyy
DOI: https://doi.org/10.48550/arXiv.1009.3836
2010-09-20
Abstract:We present direct measurements of depth-resolved band gap variations of CuIn(1-x)Ga(x)Se2 thin-film solar cell absorbers. A new measurement technique combining parallel measurements of local thin-film interference and spectral photoluminescence was developed for this purpose. We find sample-dependent correlation parameters between measured band gap depth and composition profiles, and emphasize the importance of direct measurements. These results bring a quantitative insight into the electronic properties of the solar cells and open a new way to analyze parameters that determine the efficiency of solar cells.
Optics,Materials Science,General Physics
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