Programmed Ultrafast Scan Welding of Cu Nanowire Networks with a Pulsed Ultraviolet Laser Beam for Transparent Conductive Electrodes and Flexible Circuits

Jun Wang,Han Chen,Yang Zhao,Zhibai Zhong,Yan Tang,Guozhen Liu,Xiang Feng,Fuchun Xu,Xiaohong Chen,Duanjun Cai,Junyong Kang
DOI: https://doi.org/10.1021/acsami.0c07962
2020-07-13
Abstract:Metal nanowires (NWs) have shown superior advances for the next-generation transparent conducting (TC) materials. Most concerns were focused on uniform conductive films; however, fabrication of a programmed circuit is still lacking. Here, we demonstrate a programmable ultrafast welding method by pulsed laser beam scanning under ambient conditions to achieve a Cu NW pattern-free TC circuit as well as various size films. High-aspect ratio Cu NWs (&gt; 3000) are synthesized through an oleylamine-mediated solution system. Pulsed ultraviolet laser irradiation together with a programmed moving station is set up for the welding of Cu NW networks. Finite element simulations reveal that the transient heating by efficient absorption of UV light (∼ 250 nm) could remove the organic residues on the surface and realize local welding of interlaced NW junctions. With only 10 ms pulsed irradiation, high optoelectronic performance (33 ohm/sq. at 87% transmittance at 550 nm) and excellent stability of the Cu NW TC film have been achieved. The line-by-line and selected route scanning modes could rapidly make large area TC films and directly write flexible circuits. Moreover, completely transparent micron-size UV and blue LED chips are fabricated and successfully lit with bright emission. This method opens up a future way of circuit and device fabrication by direct one-step laser writing.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c07962?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c07962</a>.Schematics of growth mechanism of Cu NWs; synthesis and characterizations of superfine Cu NWs; SEM images, SAED pattern, EDS spectrum, XPS spectrum, and TEM image; line-by-line scanning routes; UV–vis transmission spectrum; I–V curves measured after1 and 100 cycles; and structure and EL spectrum of the blue LED chip (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c07962/suppl_file/am0c07962_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,nanoscience & nanotechnology
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