A novel field plate with arcuate end for improving GaN HEMTs

Junji Cheng,Jiaping Liu,Yuanjie Luo,Gongtao He,Fanxin Meng,Zhaofeng He,Bo Yi,Haimeng Huang,Hongqiang Yang,Zhiming Wang
DOI: https://doi.org/10.1049/ell2.13256
2024-06-25
Electronics Letters
Abstract:This work reports a new field plate technique for the popular device of gallium nitride high‐electron‐mobility transistors. The proposed technique solves the inherent shortcomings of the traditional field plate technology, and significantly improves the device performance and reliability. A new field plate (FP) is proposed for gallium nitride high‐electron‐mobility transistors (HEMTs). It features an innovative arcuate end (AE), which allows the induced charges that originally gathered at the FP end to diffuse over a wider area. Hence, not only is the electric field in the channel at the gate edge alleviated due to the induced charges, but also that concentrated at the FP end is reduced by means of AE. The simulation results indicate that by upgrading a source FP with AE, HEMT gains a 99% increase in breakdown voltage while remaining unaltered in specific on‐resistance. It also gets a 43.41% decrease in power loss during one cycle while maintaining the same breakdown voltage, which greatly contributes to enhance the efficiency of power electronic circuits.
engineering, electrical & electronic
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