Abstract:The near-field magnetic probe ( -probe) is an essential diagnostic tool for analyzing electromagnetic interference in electronic products. Many types of -probes have been designed and manufactured in recent years. Nevertheless, the performance of these probes in practical magnetic field ( -field) measurement is not clear. In this article, six typical -probes with the same loop area, labeled as UHP11, SHP11, UHP12, SHP12, UHP22, and SHP22, are designed and fabricated. The key parameters that can evaluate the performance of -probes include frequency response (FR), intrusion of the probe to the device under test (DUT), spatial resolution (SR), common-mode electric field ( -field) suppression, and differential -field suppression. To analyze the key parameters of these probes, full-wave models of these -probes are simulated and compared with measurements. Meanwhile, the equivalent circuit models of these -probes are established to analyze -field suppression in -field measurement. The measurement results indicate that the shielded one-loop -probe with differential output ports (SHP12) achieves the best differential -field suppression, which is 26 dB at 5 GHz. In addition to the outstanding suppression performance on differential -field, its common-mode -field suppression is also the best and greater than 30 dB within 14.3 GHz. The SR of six -probes is basically consistent in the measurement. Except for the higher sensitivity of the two-loop -probes (UHP22 and SHP22), SHP12 shows the best comprehensive -field measurement performance.

New resonant composite magnetic‐field probes with high detection sensitivity and electric‐field suppression ratio

A new differential magnetic‐field probe with high detection sensitivity for near‐field scanning

A Resonant Magnetic Field Probe with Enhanced Sensitivity Using Quarter-wavelength Impedance Transformer

A Composite Probe With Connected Via for High Sensitivity Measurement of Electromagnetic-Field Components

A Miniature Resonant Magnetic Field Probe Integrated with MLCC

A Wideband and High Sensitivity Probe Design for Near-Field Scanning

Dual-Components Magnetic Probe for Electromagnetic Interference Measurement

A High-Sensitivity Resonant Tangential E-Probe With Loaded Improved Dipole and Embedded Integrated Balun

Improved-Sensitivity Resonant Electric-Field Probes Based on Planar Spiral Stripline and Rectangular Plate Structure

High Common-Mode-Rejection Magnetic-Field Probe Based on Differential Dual Loop and Integrated Balun

Design and Calibration of an Ungrounded Double-Loop Active Differential Magnetic Probe

An Ultrawideband Magnetic Probe With High Electric Field Suppression Ratio

A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning

Miniature Active Differential Magnetic Field Probe with High Sensitivity for Near-Field Measurements

An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency

A Wideband Tangential Electric Probe Based on Common Mode Absorbing

Comparative Analysis of Several Near-Field Probes for Magnetic Field Measurements

A Miniature Multi-Component Probe for Near-Field Scanning

A High-Frequency and High Spatial Resolution Probe Design for EMI Prediction

A New Scheme of Embedded RF Probe an Embedded Three-Port Loop of RF Parameters Detection

A Cross-Type $e_{x}$ Probe with a High $h_{y}$ Suppression