An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency

Zhi-Peng Chen,Zhen-Guo Liu,Shang Zhang,Meng-Zi Li,Wei-Bing Lu

DOI: https://doi.org/10.1109/tim.2023.3276025

IF: 5.6

2023-05-26

IEEE Transactions on Instrumentation and Measurement

Abstract:A novel enhanced-sensitivity tangential -field probe with tunable resonant frequency is proposed in this article. This -field probe consists of a front-end electric dipole induction part, tunable coupling resonators, a balun transmission section, and a coplanar waveguide transmission part. By introducing an improved electric dipole-induced element and resonant transmission, the detection sensitivity of the -field probe can be significantly improved. Varactor diodes are loaded into the coupling resonators to achieve an adjustable resonant center frequency, thereby minimizing the contradiction between the high sensitivity and test bandwidth of the resonant -field probe. A prototype of this tunable resonant frequency probe was fabricated and measured. When the reverse bias voltage applied to the varactors was tuned from 0 to 20 V, the probe could obtain enhanced-sensitivity tangential -field detection within the frequency band of 1.61–2.30 GHz. Moreover, this probe was also adopted to measure the -field components in some areas of the microstrip line and antenna based on FR4. This probe can improve detection efficiency and reduce test costs on the premise of enhanced sensitivity detection. It has broad application prospects for near-field measurement in the future.

engineering, electrical & electronic,instruments & instrumentation