Dual-Components Magnetic Probe for Electromagnetic Interference Measurement

Ze-Kai Hu,Xing-Chang Wei
DOI: https://doi.org/10.1109/aps/ursi47566.2021.9704436
2021-01-01
Abstract:In this paper, a dual-components magnetic probe which can measure the magnetic fields $H_{x}$ and $H_{y}$ at the same time is proposed. The dual-components probe saves lots of scanning time when one need to measure both $H_{x}$ and $H_{y}$ in electromagnetic interference measurement. Its working frequency ranges from 20MHz to 6GHz. The probe is designed based on a four-layered printed circuit board. The simulation and measurement results show that the sensitivity of the fabricated probe is high, and even higher than the commercial single component magnetic probe.
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