Abstract:The limits of chip technology are constantly being pushed with the continuous development of integrated circuit manufacturing processes and equipment. Currently, chips contain several billion, and even tens of billions, of transistors, making chip testing increasingly challenging. The verification of very large-scale integrated circuits (VLSI) requires testing on specialized automatic test equipment (ATE), but their cost and size significantly limit their applicability. The current FPGA-based ATE is limited in its scalability and support for few test channels and short test vector lengths. As a result, it is only suitable for testing specific chips in small-scale circuits and cannot be used to test VLSI. This paper proposes a low-cost hardware and software solution for testing digital integrated circuits based on design for testability (DFT) on chips, which enables the functional and performance test of the chip. The solution proposed can effectively use the resources within the FPGA to provide additional test channels. Furthermore, the round-robin data transmission mode can also support test vectors of any length and it can satisfy different types of chip test projects through the dynamic configuration of each test channel. The experiment successfully tested a digital signal processor (DSP) chip with 72 scan test pins (theoretically supporting 160 test pins). Compared to our previous work, the work in this paper increases the number of test channels by four times while reducing resource utilization per channel by 37.5%, demonstrating good scalability and versatility.

Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL

Design and FPGA Verification of a Novel Reliable Real-Time Data Transfer System

An FPGA-based system for generalised electron devices testing

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

Low cost Design-for-Testability features for System-on-Chip: Case study

Design for HW/SW Co-Testing Based on FPGA

High-speed data transfer with FPGAs and QSFP+ modules

FPGA based low-cost Portable Tester with On-Board Supplies

Multi-channel Parallel Signal Acquisition and 10G High-speed Transmission System

High-Speed Serial Optical Link Test Bench Using FPGA with Embedded Transceivers

Test Methods For Fpga Switching Characteristics On Gpete Test Platform

Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters

A Testing System for High Speed Multi-Channel Adc with Lvds Data Output Based on Fpga

Cost-Effective Energy Monitoring of a Zynq-Based Real-Time System Including Dual Gigabit Ethernet

Design Of Parallel Multi-Channel High Speed Data Acquisition Module Based On Pc104

Chip Tester Based on FPGA Commonly Used in Laboratory

Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

Design, package and test of ultra high-speed low power 4:1 multiplexer

Design of High-speed Data Acquisition and Control System Based on Multiple FPGA Chips

FPGA Prototyping of A Millimeter-Wave Multiple Gigabit WLAN System