Interface Dynamic Investigation of Nitrogen Doped 3YSZ (3YSZ:N)

Tao Liu,Xu Shi,Feifan Li,Zhen Zhang,Jingkun Yu
DOI: https://doi.org/10.1149/1945-7111/ac5549
IF: 3.9
2022-03-01
Journal of The Electrochemical Society
Abstract:Y 2 O 3 stabilized zirconia (3YSZ, 3 mol%) and nitrogen doped 3YSZ (3YSZ:N) were prepared and characterized by cyclic voltammetry (CV), cathodic polarization and Tafel curve. Through electrochemical methods, the interface kinetic properties of the Pt/YSZ:N system and the reaction process of nitrogen have been studied. At low temperatures, O 2− undergo electrochemical reactions. Nitrogen ions show high reactivity above 650 °C. Nitrogen transfer occurred in at least two steps. First step was the loss of electrons from N 3− to obtain intermediate product, and second step was the loss of electrons from intermediate product to obtain nitrogen. Both reactions were controlled by diffusion, and apparent transfer coefficient of the reaction was calculated to be 0.39 and 0.27 with exchange current density of 2.59 × 10 −3 A·cm −2 .
electrochemistry,materials science, coatings & films
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