Ultrahigh Incorporation of Tin in SiSn Nanowires Grown via In-Plane Solid-Liquid-Solid Mechanism

Edy Azrak,Zhaoguo Xue,Shuai Liu,Wanghua Chen,Celia Castro,Sébastien Duguay,Philippe Pareige,Linwei Yu,Pere Roca i Cabarrocas
DOI: https://doi.org/10.1016/j.apsusc.2023.156637
IF: 6.7
2023-05-01
Applied Surface Science
Abstract:We report on the growth of sn-catalyzed in-plane silicon nanowires (SiNWs) using the solid–liquid-solid (SLS) mechanism and their application to nano-electronics. The in-plane SLS growth process allows us to obtain very high tin concentrations ∼ 10 at.% (more than 1000 times the expected concentration from the phase diagram). The growth is achieved in a plasma-enhanced chemical vapor deposition reactor, in a single pump-down process. Atom probe tomography (APT) and transmission electron microscopy (TEM) are used to assess the composition of these SiSn NWs. The atomic-scale investigation shows that Sn atoms are similarly distributed in crystalline SiSn NWs grown at 300 °C and 400 °C, with different sn-enrichments along structural defects. A NW-based field-effect transistor (FET) is fabricated in which a SiSn NW is implemented as the channel for charge transport, reaching a field effect hole mobility of 80 cm2/V.s.
chemistry, physical,physics, applied, condensed matter,materials science, coatings & films
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