Optical crosstalk photon penetration depth in Silicon Photomultipliers

Chen Zhang,Guoqing Zhang,Xinyue Cao,Chunling Zhang,Lianbi Li

DOI: https://doi.org/10.1016/j.ijleo.2021.166864

IF: 3.1

2021-08-01

Optik

Abstract:<p>In recent years, many researchers have explored the application of Silicon Photomultipliers (SiPMs) in various weak light detection fields. Optical crosstalk probability (Pct) is one of the most important parameters of the SiPM, so the performance of the device may be optimized by further research on the Pct mechanism. The two-dimensional (2D) and 1D spatial distribution analysis of optical crosstalk probability in a typical SiPM were employed in this study via pulsed laser focusing and precision displacement methods in order to obtain the penetration depth of optical crosstalk photons in the SiPM. It was believed that there are five propagating modes of crosstalk photons in SiPM. One of the propagating modes is that the crosstalk photons generated by an avalanche photodiode (APD) cell passing through the substrate material and reflecting to other APD cells at the bottom interface of the substrate, thus causing other APD cells to avalanche. However, the probability of this crosstalk photon propagating mode appears to be negligible. By fitting the experimental results, the penetration depth of crosstalk photons in the SiPM was determined to be less than 22 micrometers. As the substrate thickness of most SiPMs is more than 300 micrometers, the probability of crosstalk photons passing through SiPM substrate material and reflecting to other APD is less than 1.4 E-12. Therefore, this crosstalk mode needs not be considered in the crosstalk mechanism analysis of SiPMs. A novel technique for measuring the effective propagating distance of the crosstalk photons in SiPMs was developed which can be used to characterize the effective action distance of the crosstalk photons in different structures and types of SiPMs. This work may provide a reference for the design and fabrication of SiPMs in the future.</p>

optics

What problem does this paper attempt to address?

This paper aims to explore the optical crosstalk effect in Silicon Photomultipliers (SiPMs), especially the penetration depth of optical crosstalk photons in SiPMs. The research obtains the penetration depth of optical crosstalk photons in SiPMs by analyzing the two - dimensional (2D) and one - dimensional (1D) spatial distributions of the optical crosstalk probability (Pct) in typical SiPMs, using the pulsed laser focusing and precision displacement methods. The research shows that there are five propagation modes of optical crosstalk photons in SiPMs, but one of the modes - that is, the crosstalk photons generated by the avalanche photodiode (APD) unit pass through the substrate material and are reflected at the bottom interface of the substrate to other APD units, causing the avalanche probability of other APD units to be very low and negligible. Through the fitting of experimental data, it is determined that the penetration depth of optical crosstalk photons in SiPMs is less than 22 micrometers. This finding provides an important reference for the optimization of SiPM design and manufacturing.

Specifically, the paper addresses the following key issues:
1. **In - depth understanding of the optical crosstalk mechanism**: Through experimental data and theoretical analysis, the understanding of the optical crosstalk mechanism in SiPMs is deepened.
2. **Measurement of the penetration depth of optical crosstalk photons**: A new technique is proposed to measure the effective propagation distance of optical crosstalk photons in SiPMs.
3. **Optimization of design and manufacturing**: It provides an important reference basis for the future design and manufacturing of SiPMs, especially in reducing optical crosstalk.

These research results are helpful to improve the overall performance of SiPMs, especially in the performance in low - light detection applications.