X‐Ray Calc 3: improved software for simulation and inverse problem solving for X‐ray reflectivity

Oleksiy V. Penkov,Mingfeng Li,Said Mikki,Alexander Devizenko,Ihor Kopylets
DOI: https://doi.org/10.1107/s1600576724001031
IF: 4.868
2024-03-17
Journal of Applied Crystallography
Abstract:This work introduces X‐Ray Calc 3, an open‐source software package for simulating X‐ray reflectivity (XRR) and reconstructing film structures on the basis of measured XRR curves, featuring a user‐friendly interface and improved fitting capabilities.This work introduces X‐Ray Calc (XRC), an open‐source software package designed to simulate X‐ray reflectivity (XRR) and address the inverse problem of reconstructing film structures on the basis of measured XRR curves. XRC features a user‐friendly graphical interface that facilitates interactive simulation and reconstruction. The software employs a recursive approach based on the Fresnel equations to calculate XRR and incorporates specialized tools for modeling periodic multilayer structures. This article presents the latest version of the X‐Ray Calc software (XRC3), with notable improvements. These enhancements encompass an automatic fitting capability for XRR curves utilizing a modified flight particle swarm optimization algorithm. A novel cost function was also developed specifically for fitting XRR curves of periodic structures. Furthermore, the overall user experience has been enhanced by developing a new single‐window interface.
chemistry, multidisciplinary,crystallography
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