Abstract:Molecular dynamics simulations have been used to study a collective atomic transport phenomenon by repeated Ar$^+$ irradiations in the Ti/Pt interfacial system. The ion-induced injection of surface atoms to the bulk, the ejection of bulk atoms to the top layers together with surface erosion is strongly enhanced by interfacial mixing. This process leads to a dense interfacial material, and broadening of the interface region. The process scales with the relative difference of the atomic masses. We find that surface roughening and interfacial mixing is strongly coupled via an enhanced counterflow material transport normal to the surface which might be a novel surface damage mechanism. This cooperative phenomenon is active when the bilayer system is subjected to a high dose ion irradiation (multiple ion irradiations) and leads to surface cavity growth.

What problem does this paper attempt to address?

### Problems the paper attempts to solve This paper aims to explore the surface roughening and interface mixing phenomena in double - layer metal systems (such as Ti/Pt) under low - energy ion irradiation. Specifically, the author studied the effects of repeated Ar⁺ ion irradiation on the titanium - platinum (Ti/Pt) interface system through molecular dynamics simulations. The core problem of the paper is to reveal a possible novel surface damage mechanism, that is, the enhanced material transport caused by interface mixing, which leads to surface roughening and cavity growth. #### Main problems: 1. **Coupling of surface roughening and interface mixing**: It was found that surface roughening and interface mixing are strongly coupled, which is achieved through enhanced material transport perpendicular to the surface. This synergistic phenomenon may be a novel surface damage mechanism that has not been reported before. 2. **Mass transport in multi - layer systems**: For a thin - layer system composed of different atoms, when subjected to low - energy ion irradiation, surface erosion is mainly caused by mass transport driven by interface mixing rather than sputtering. 3. **Influence of atomic mass differences**: The study pointed out that mass transport and surface roughening are mainly determined by the mass differences between the atoms that make up each layer, rather than chemical forces (such as mixing heat). ### Key conclusions: - There is a strong coupling relationship between surface roughening and interface mixing. - In double - layer metal systems, surface erosion is mainly caused by interface mixing rather than simple sputtering. - The atomic mass difference is a key factor in controlling interface mixing and surface roughening. - This phenomenon may be applicable to other multi - component systems, especially in the case of low - energy ion irradiation and the interface is close to the free surface. ### Formula explanation: The formulas involved in the paper are mainly used to calculate the degree of interface mixing. For example, the calculation formula for interface broadening $ b $ is: \[ b=\frac{1}{N_{\text{mix}}} \sum_{i = 1}^{N_{\text{mix}}} \Delta z_i \] where $ N_{\text{mix}} $ is the number of mixed atoms, and $ \Delta z_i $ is the change in the depth position of the $ i $-th mixed atom relative to the interface. These research results not only help to understand the surface damage mechanism of double - layer metal systems, but also provide an important basis for developing a more accurate theory of surface morphology development.

Cooperative mixing induced surface roughening in bilayer metals: a possible novel surface damage mechanism

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