Abstract:Micromechanically exfoliated mono- and multilayers of molybdenum disulfide (MoS2) are investigated by spectroscopic imaging ellipsometry. In combination with knife edge illumination, MoS2 flakes can be detected and classified on arbitrary flat and also transparent substrates with a lateral resolution down to 1 to 2 um. The complex dielectric functions from mono- and trilayer MoS2 are presented. They are extracted from a multilayer model to fit the measured ellipsometric angles employing an anisotropic and an isotropic fit approach. We find that the energies of the critical points of the optical constants can be treated to be independent of the utilized model, whereas the magnitude of the optical constants varies with the used model. The anisotropic model suggests a maximum absorbance for a MoS2 sheet supported by sapphire of about 14 % for monolayer and of 10 % for trilayer MoS2. Furthermore, the lateral homogeneity of the complex dielectric function for monolayer MoS2 is investigated with a spatial resolution of 2 um. Only minor fluctuations are observed. No evidence for strain, for a significant amount of disorder or lattice defects can be found in the wrinkle-free regions of the MoS2 monolayer from complementary Raman spectroscopy measurements. We assume that the minor lateral variation in the optical constants are caused by lateral modification in the van der Waals interaction presumably caused by the preparation using micromechanical exfoliation and viscoelastic stamping.

Imaging the Quantum Capacitance of Strained MoS 2 Monolayers by Electrostatic Force Microscopy

Imaging the Quantum Capacitance of Strained MoS2 Monolayers by Electrostatic Force Microscopy

Elucidating Piezoelectricity and Strain in Monolayer MoS 2 at the Nanoscale Using Kelvin Probe Force Microscopy

Enhanced Electromechanical Response Due to Inhomogeneous Strain in Monolayer MoS 2

Monitoring Local Strain Vector in Atomic-Layered MoSe2 by Second-Harmonic Generation

Dynamic Structural Response and Deformations of Monolayer $MoS_{2}$ Visualized by Femtosecond Electron Diffraction

Electronic transport modulation on few-layers suspended MoS$_2$ under strain

Pressure confinement effect in MoS2 monolayers.

Monolayer MoS$_2$ Strained to 1.3\% with a Microelectromechanical System

Strain-Modulated Interlayer Charge and Energy Transfers in MoS2/WS2 Heterobilayer

Optical detection of strain and doping inhomogenieties in single layer MoS2

Imaging Spectroscopic Ellipsometry of Mono- and Few-layer MoS2

Mesoscale Imperfections in MoS2 Atomic Layers Grown by a Vapor Transport Technique.

Quantum mechanical rippling of a MoS2 monolayer controlled by interlayer bilayer coupling

Strain-Engineered Ferroelectricity in 2H Bilayer MoS 2

Mesoscale Imperfections in MoS2 Atomic Layers Grown by Vapor Transport Technique

Electromechanics in MoS2 and WS2: nanotubes vs. monolayers

High Strain Engineering of a Suspended WSSe Monolayer Membrane by Indentation and Measured by Tip-enhanced Photoluminescence

Imaging the electron charge density in monolayer MoS 2 at the Ångstrom scale

Magneto‐optical Properties of Monolayer MoS2‐SiO2/Si Structure Measured Via Terahertz Time‐domain Spectroscopy

Tuning Optical Signatures of Single- and Few-Layer MoS2 by Blown-Bubble Bulge Straining Up to Fracture.