ID20 – opportunities for inelastic X-ray scattering at extreme conditions

Christoph J. Sahle,Sylvain Petitgirard,Georg Spiekermann,Robin Sakrowski,Noora Suomalainen,Florent Gerbon,Jeroen Jacobs,Yves Watier,Christian Sternemann,Marco Moretti Sala,Valerio Cerantola
DOI: https://doi.org/10.1080/08957959.2024.2356523
2024-05-26
High Pressure Research
Abstract:Owing to the availability of bright X-rays sources such as the ESRF-EBS, inelastic X-ray scattering of samples contained in complex sample environments, including high pressure devices, has become feasible. Compared to well-established characterization techniques such as X-ray diffraction or X-ray absorption fine structure spectroscopy, inelastic X-ray scattering of samples under extreme conditions is a relatively novel probe. However, unique information about the electronic, magnetic, and local atomic structure is accessible with inelastic X-ray scattering. Here, capabilities of beamline ID20 of the ESRF in the field of high pressure inelastic X-ray scattering are presented and some recent activities are reviewed.
physics, multidisciplinary
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