Abstract:A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend). This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 microm spot of approximately 5x10(9) photons/s (0.1% bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored by two pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 microm are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (approximately 0.2 microm) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10(-5) strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (approximately 150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

Development of a new state-of-the-art beamline optimized for monochromatic single-crystal and powder X-ray diffraction under extreme conditions at the ESRF

The high flux nano-X-ray diffraction, fluorescence and imaging beamline ID27 for science under extreme conditions on the ESRF Extremely Brilliant Source

New opportunities for high pressure X-ray absorption spectroscopy at ID24-DCM and BM23 with the Extremely Brilliant Source of the ESRF

A System for Doing Low Temperature-High Pressure Single Crystal X-ray Diffraction with a Synchrotron Source

The high power laser facility at beamline ID24-ED at the ESRF

ID20 – opportunities for inelastic X-ray scattering at extreme conditions

Dynamic loading platforms coupled to ultra-high speed X-ray imaging at beamline ID19 of the European Synchrotron ESRF

Development of a laser-driven shock compression platform for time-resolved XRD experiments at the ID09 beamline of the European Synchrotron Radiation Facility

Tracking structural phase transitions via single crystal x-ray diffraction at extreme conditions: advantages of extremely brilliant source

Advanced Non-Destructive in Situ Characterization of Metals with the French Collaborating Research Group D2AM/BM02 Beamline at the European Synchrotron Radiation Facility

A Dedicated Superbend X-Ray Microdiffraction Beamline for Materials, Geo-, and Environmental Sciences at the Advanced Light Source

New Synchrotron Powder Diffraction Facility for Long-Duration Experiments

High pressure phonon spectroscopy at ESRF: ID28 beamline

Ode: A New Beam Line for High-Pressure Xas and Xmcd Studies at Soleil

X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

The ESRF dark-field x-ray microscope at ID03

Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source

A Focusing System for X-ray Diffraction Studies of Materials under High Pressure in the Diamond Cell

New developments in high-pressure X-ray diffraction beamline for diamond anvil cell at SPring-8

APPLICATION OF SYNCHROTRON RADIATION TO HIGH PRESSURE X-RAY DIFFRACTION

A dynamic focusing x‐ray monochromator for a wiggler beam line at the SRS of the SERC Daresbury Laboratory (abstract)