Inelastic X-Ray Scattering at Ultrahigh Pressures

HK Mao,CC Kao,RJ Hemley
DOI: https://doi.org/10.1088/0953-8984/13/34/323
2001-01-01
Journal of Physics Condensed Matter
Abstract:Inelastic x-ray scattering (IXS) provides high-pressure research with an arsenal of analytical capabilities for key measurements that were previously unattainable, and high-pressure research provides IXS with numerous applications where the technique has unique advantages over other methods. High-pressure investigations can now be conducted using non-resonant IXS, resonant IXS, nuclear resonant IXS and x-ray emission spectroscopy with energy resolutions of 100 meV to 1 eV for electronic transitions and 1 to 10 meV for phonon studies. By pressure-tuning materials over a wide range, we are able to investigate fundamental properties of the electron gas, strongly correlated electron systems, high-energy electronic excitations and phonons in energy and momentum space. The results have important implications for a variety of materials problem applications as well as providing basic information for understanding the deep interior of the Earth and other planets.
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