Universal Limit for Air-Stable Molecular n-Doping in Organic Semiconductors

Martin Schwarze,Max L. Tietze,Frank Ortmann,Hans Kleemann,Karl Leo
DOI: https://doi.org/10.1021/acsami.0c04380
2020-08-04
Abstract:The air sensitivity of n-doped layers is crucial for the long-term stability of organic electronic devices. Although several air-stable and highly efficient n-dopants have been developed, the reason for the varying air sensitivity between different n-doped layers, in which the n-dopant molecules are dispersed, is not fully understood. In contrast to previous studies that compared the air stability of doped films with the energy levels of neat host or dopant layers, we trace back the varying degree of air sensitivity to the energy levels of integer charge transfer states (ICTCs) formed by host anions and dopant cations. Our data indicate a universal limit for the ionization energy of ICTCs above which the n-doped semiconductors are air-stable.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c04380?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c04380</a>.Electronic properties of n-doped semiconductors, development of absolute conductivity upon air exposure, air sensitivity of n-doped F<sub><i>n</i></sub>ZnPc, correlation of conductivity reduction and Fermi level shift upon air exposure, broadening of UPS spectra upon air exposure, air stability over IE<sub>ICTC</sub>, and conductivity recovery by thermal treatment (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c04380/suppl_file/am0c04380_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,nanoscience & nanotechnology
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