Development and commissioning of the UNIST electron beam ion trap

SungNam Park,Bokkyun Shin,Emre Cosgun,JeHwan Han,Moses Chung
DOI: https://doi.org/10.1007/s40042-023-01002-6
2024-02-04
Journal of the Korean Physical Society
Abstract:An electron beam ion trap (EBIT) creates and confines highly charged ions (HCIs). To maximize the movement of the EBIT towards and away from the accelerator beamlines, we adopted permanent magnets, thereby reducing the size and maintenance costs associated with the EBIT. A magnetic field of 084 T at the trap center provided a trap capacity of approximately charges. By sweeping the electron beam energy from 24 keV to 33 keV at an electron beam current of 10 mA, the silicon drift detector successfully measured the KLL lines of the HCI states of argon and confirmed the presence of up to He-like argon ions. Before measuring the highly charged irons for astrophysics purposes, we conducted preliminary experiments to connect the EBIT with the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) hard X-ray beamline. In this study, we present the initial operation of the compact EBIT at an XFEL facility, demonstrating its X-ray fluorescence measurement capability.
physics, multidisciplinary
What problem does this paper attempt to address?