Negative Differential Resistance Device with High Peak-to-Valley Ratio Realized by Subband Resonant Tunneling of Γ-Valley Carriers in WSe 2 / h -BN/WSe 2 Junctions

Kei Kinoshita,Rai Moriya,Seiya Kawasaki,Shota Okazaki,Momoko Onodera,Yijin Zhang,Kenji Watanabe,Takashi Taniguchi,Takao Sasagawa,Tomoki Machida
DOI: https://doi.org/10.1021/acsnano.4c09569
IF: 17.1
2024-10-15
ACS Nano
Abstract:Resonant tunneling diodes (RTDs) are a core technology in III-V semiconductor devices. The realization of high-performance RTD using two-dimensional (2D) materials has been long awaited, but it has yet to be accomplished. To this end, we investigate a range of WSe(2)/h-BN/WSe(2) RTD devices by varying the number of layers of source and drain WSe(2). The highest peak-to-valley ratio (PVR) is demonstrated in the three-layer (3L) WSe(2)/h-BN/1-layer (1L) WSe(2) structure. The observed PVR values of...
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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