Abstract:The 3D finite difference time domain (FDTD) method was employed to simulate the polarization characteristic of the tapered metal-coated optical fiber probe in the near-field optical. The Scanning Near-field Optic Microscopy (SNOM)'s applications would be extended by controlling the exit light's polarization of the optical fiber probe and analyzing the polarized light which passes through the sample. Uniaxial Perfectly Matched Layers (UPMLs) are used for the Absorbing Boundary Condition, and the Drude model is used to deal with the non-magnetic metal. The light intensity distribution near the optical fiber tip was calculated with linear-polarized incident light. A general relationship between the extinction ration and the probe varying with its relevant parameters has been found by means of making alternations on the aperture diameter(40nm-120nm), the cone angle(20 degrees-90 degrees), the thickness of metal film(50nm-150nm) and material(silver, aluminum) as well as the incident light wavelength(350nm-1000nm) and other parameters. The results show that the above multi parameters have produced a co-effect on the polarization characteristics of the optical fiber probe. Once the other parameters remain constant, the extinction ratio is increasing as the aperture diameter or metal film thickness increases. And the extinction ratio could be decreasing, increasing or fluctuant as the cone angle increases in the different conditions. Al's extinction ration usually is better than Ag's under the same conditions. The wavelength's impact should be linked to the metal's complex permittivity. Therefore, the results have positive significance to the design and application of the high extinction ratio fiber probe.

Precise characterization of polarizing prisms by optical localization analysis

Analysis of the Distribution Characteristics of the States of Polarization Based on Improved Delaunay Triangulation Algorithm

Polarization-interferometry-based Wavelength-Interrogation Surface Plasmon Resonance Imager for Analysis of Microarrays

Polarization interference interrogation of angular surface plasmon resonance sensors with wide metal film thickness tolerance

The Effect of Polarization Light on Optical Imaging System

Analysis Methods for Polarization State and Energy Transmission of Rays Propagating in Optical Systems

Calculation of the Optical Path Difference and Fringe Location in Polarization Interference Imaging Spectrometer

Three-dimensional Characterization of Tightly Focused Fields for Various Polarization Incident Beams.

High-precision Interference Measurements of Phase Shift Between Orthogonal Linear Polarized Beams at Total Internal Reflection

A polarimeter based on electric-optical material

Comprehensive Design and Calibration of an Even Aspheric Quarter-Wave Plate for Polarization Point Diffraction Interferometry.

Calibration of Polarization Effect of a High-Numerical-aperture Objective Lens with Mueller Matrix Polarimetry

Numerical Calculation Of Optical Probe'S Polarization Characteristics

Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing

Calculation and Analysis of the Optical Path Difference of Modified Wollaston Prism

Design And Analysis Of A Pair Of Prisms For Widening The Imaging Range Of An Optical System

Single-Shot Quantitative Polarization Imaging of Complex Birefringent Structure Dynamics

Polarisation Control Through an Optical Feedback Technique and Its Application in Precise Measurements

Single-incidence Polarimetry for Optical Characteristics

Determination of zero incident angle by optical feedback effect and its applications in the measurement of refractive indices

Characterization of optical aberrations with scanning pentaprism for large collimators