Resonant Raman imaging of MoS2-substrate interaction

Hongyuan Li,Dmitri V. Voronine
DOI: https://doi.org/10.48550/arXiv.1612.03354
2016-12-10
Materials Science
Abstract:We report a study of long-range MoS2-substrate interaction using resonant Raman imaging. We observed a strong thickness-dependent peak shift of a Raman-forbidden mode that can be used as a new method of determining the thickness of multilayered MoS2 flakes. In addition, dependence of the Raman scattering intensity on thickness is explained by the interference enhancement theory. Finally, the resonant Raman spectra on different substrates are analysed.
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