Abstract:Micromechanically exfoliated mono- and multilayers of molybdenum disulfide (MoS2) are investigated by spectroscopic imaging ellipsometry. In combination with knife edge illumination, MoS2 flakes can be detected and classified on arbitrary flat and also transparent substrates with a lateral resolution down to 1 to 2 um. The complex dielectric functions from mono- and trilayer MoS2 are presented. They are extracted from a multilayer model to fit the measured ellipsometric angles employing an anisotropic and an isotropic fit approach. We find that the energies of the critical points of the optical constants can be treated to be independent of the utilized model, whereas the magnitude of the optical constants varies with the used model. The anisotropic model suggests a maximum absorbance for a MoS2 sheet supported by sapphire of about 14 % for monolayer and of 10 % for trilayer MoS2. Furthermore, the lateral homogeneity of the complex dielectric function for monolayer MoS2 is investigated with a spatial resolution of 2 um. Only minor fluctuations are observed. No evidence for strain, for a significant amount of disorder or lattice defects can be found in the wrinkle-free regions of the MoS2 monolayer from complementary Raman spectroscopy measurements. We assume that the minor lateral variation in the optical constants are caused by lateral modification in the van der Waals interaction presumably caused by the preparation using micromechanical exfoliation and viscoelastic stamping.

Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes

Newly observed first-order resonant Raman modes in few-layer MoS$_2$

Low-Frequency Raman Modes And Electronic Excitations In Atomically Thin Mos2 Films

Low-Frequency Raman Modes and Electronic Excitations In Atomically Thin MoS2 Crystals

Observation of Low-Frequency Raman Modes and Electronic Excitations in Atomically Thin MoS$_{2}$ Crystals

Anomalous Lattice Vibrations of Single and Few-Layer MoS2

From Bulk to Monolayer MoS2: Evolution of Raman Scattering

Raman scattering in few-layer MoTe$_{2}$

Imaging Spectroscopic Ellipsometry of Mono- and Few-layer MoS2

The shear mode of multilayer graphene

Resonant Raman imaging of MoS2-substrate interaction

Interlayer breathing and shear modes in few-trilayer MoS2 and WSe2

Enhanced Ultra-Low-frequency Interlayer Shear Modes in Folded Graphene Layers.

Raman modes of MoS2 used as fingerprint of van der Waals interactions in 2-D crystal-based heterostructures.

Stacking-Dependent Interlayer Phonons in 3R and 2H MoS$_{2}$

Lattice dynamics in mono- and few-layer sheets of WS2 and WSe2

Abnormal Out-of-Plane Vibrational Raman Mode in Electrochemically Intercalated Multilayer MoS 2

Raman Vibrational Spectra of Bulk to Monolayer ReS2 with Lower Symmetry

Raman spectroscopic study of the layer-dependent Davydov splitting and thermal conductivity of chemically vapor deposited two-dimensional MoSe2

High-yield helicity-resolved Raman scattering with in-plane propagation of light in monolayer MoS 2

Interlayer interaction on twisted interface in incommensurate stacking MoS 2 : A Raman spectroscopy study.