Extreme‐Angle Silicon Infrared Optics Enabled by Streamlined Surfaces

Fei Zhang,Mingbo Pu,Xiong Li,Xiaoliang Ma,Yinghui Guo,Ping Gao,Honglin Yu,Min Gu,Xiangang Luo

DOI: https://doi.org/10.1002/adma.202008157

IF: 29.4

2021-02-10

Advanced Materials

Abstract:<p>Infrared optical systems are indispensable in almost all domains of society, but their performances are often restricted by bulky size, small field of view, large thermal sensitivity, high fabrication cost, etc. Here, based on the concept of catenary optics, a novel isophase streamline optimization approach is leveraged to design silicon complementary metal–oxide–semiconductor (CMOS)‐compatible metasurfaces with broadband, wide‐angle, and high‐efficiency performances, which breaks through the glass ceiling of traditional optical technologies. By using the truly local geometric phase, a maximum diffraction efficiency approaching 100% is obtained in ultrawide spectral and angular ranges. Somewhat surprising results are shown in that wide‐angle diffraction‐limited imaging and laser beam steering can be realized with a record field of view up to 178°. This methodology is scalable to the entire optical band and other materials, enabling unprecedented compact infrared systems for surveillance, unmanned vehicles, medical science, etc.</p>

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology

What problem does this paper attempt to address?

This paper attempts to solve several long - standing challenges in traditional infrared optical systems, including large volume, high thermal sensitivity, small field - of - view angle (FOV), high manufacturing cost and limited available materials. Specifically:

1. **Thermal Sensitivity Problem**: The refractive index of most infrared materials varies significantly more with temperature than that of ordinary optical glass, resulting in a large thermal focal shift.
2. **Material Limitations**: The lack of high - quality infrared materials makes the complex design of infrared optical systems more difficult.
3. **Optical System Complexity**: According to aberration theory, if high - resolution imaging is required under a large field - of - view angle, the complexity of the optical system (including the number of optical elements and the surface curvature) will further increase.
4. **Absorption Loss**: Traditional large - size optical elements have high absorption losses due to their large thickness, especially in the long - wave infrared region, where the absorption loss of silicon materials is particularly high.

To solve these problems, the paper proposes a silicon - based infrared optical system design method based on streamline optimization. By using continuous streamline - shape optimization techniques, it achieves broadband, high - efficiency, and ultra - wide - angle wave - front control capabilities. This method breaks through the limitations of traditional optical techniques in the following ways:

- **Broadband, High - Efficiency, Ultra - Wide - Angle Performance**: By optimizing the continuous streamline shape, unnecessary diffraction orders are eliminated, achieving a maximum diffraction efficiency close to 100% and performing excellently in an ultra - wide spectral and angular range.
- **Ultra - Wide - Angle Imaging**: It achieves diffraction - limited imaging and laser beam scanning at a maximum field - of - view angle of 178°.
- **Compatibility with CMOS Technology**: The silicon - based planar optical system is compatible with CMOS technology, providing new opportunities for integrated optoelectronic systems.

In conclusion, this paper aims to design a silicon - based infrared optical system with broadband, high - efficiency, and ultra - wide - angle performance through innovative streamline optimization techniques, thereby overcoming many limitations in traditional infrared optical systems.