Probing Grain-boundary Structure and Electrostatic Characteristics in a SrTiO 3 Bi-crystal by 4D-STEM

Chao Yang,Yi Wang,Wilfried Sigle,Peter A. van Aken
DOI: https://doi.org/10.1017/s143192762200294x
IF: 4.0991
2022-07-23
Microscopy and Microanalysis
Abstract://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS143192762200294X/resource/name/firstPage-S143192762200294Xa.jpg
materials science, multidisciplinary,microscopy
What problem does this paper attempt to address?