Abstract:We present direct evidence, for the first time, for the flash‐induced generation of crystal defects in single‐crystal cubic zirconia. The defects are characterized by multiple techniques. The crystals were flashed and then cooled down to ambient temperature in Ar atmosphere to preserve the electronic conductivity from the steady state of flash. Transmission electron microscopy revealed colonies of defects. The crystal structure, the non‐stoichiometry, and the electronic structure of oxygen ions within these colonies were characterized. They consist of oxygen‐depleted compositions. Selected area electron diffraction revealed the structure of these zirconia suboxides to be epitaxially coherent with the parent cubic structure but with a smaller lattice parameter. Electron energy loss spectroscopy spectra showed the peak near 25 mV to shift toward metallic zirconium. The electronic conductivity of the flashed cubic zirconia is attributed to this suboxide phase. The phase also gave rise to new peaks in Raman spectroscopy. A surprising finding was the presence of a distinct, ∼30 nm thick layer of the suboxide on the surface of the crystal. The surface layer showed a high degree of oxygen deficiency. It was also epitaxial, but with an even smaller lattice parameter than the defect colonies underneath the surface. Mechanical polishing of the crystal to remove this surface layer gave a broad view of the interconnected network of defects across the entire specimen; the length scale of this network was about 0.2 mm. Recent work, where an overlay of a magnetic field caused the flash to migrate from a flashing surface into a free‐standing workpiece, suggests the presence of evanescent plasma, which may have a connection to this surface layer.

Microstructure and defect gradients in DC and AC flash sintered ZnO

Effects of electric field on microstructure evolution and defect formation in flash-sintered TiO2

Thermal Runaway, Flash Sintering and Asymmetrical Microstructural Development of ZnO and ZnO-Bi2O3 under Direct Currents

Electric field-induced grain boundary degradation mechanism in yttria stabilized zirconia

Formation of liquid phase and nanostructures in flash sintered ZnO

Defects in flash-sintered ceramics and their effects on mechanical properties

Defect-Related Electroluminescence from Metal-Oxide-Semiconductor Devices with Zro2 Films on Silicon

Temperature effect on mechanical response of flash-sintered ZnO by in-situ compression tests

Effects of amorphous phase and yttrium on flash sintering and microstructures of ZrO2–SiO2 ceramic nanocomposites

Staged Microstructural Study of Flash Sintered Titania

Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy

Transmission Electron Microscopy Investigation of the Micro-Defects in Czochralski Silicon

Temperature effect on mechanical response of flash-sintered ZnO by <i>in-situ</i> compression tests

Effects of processing conditions on flash sintering of commercial ZrN

&Lt;i>in Situ</i> Studies on Defects Formation Dynamics in Flash-Sintered TiO &Lt;sub>2</sub>

Effects of incubation on microstructure gradient in flash-sintered TiO2

Microstructure effects on the local order and electronic defects in (Al, Ti, Mg) co-doped ZnO conductive ceramics

Key microstructural characteristics in flash sintered 3YSZ critical for enhanced sintering process

A versatile defect engineering strategy for room-temperature flash sintering

Microstructure-driven mechanical and electromechanical phenomena in additively manufactured nanocrystalline zinc oxide

Mechanical behavior of ZrO2 ceramics in the post-flash stage