Atomic Force Microscopy beyond Topography: Chemical Sensing of 2D Material Surfaces through Adhesion Measurements

Isaac Brotons-Alcázar,Jason S Terreblanche,Silvia Giménez-Santamarina,Gerliz M Gutiérrez-Finol,Karl S Ryder,Alicia Forment-Aliaga,Eugenio Coronado
DOI: https://doi.org/10.1021/acsami.3c19254
IF: 9.5
2024-04-03
ACS Applied Materials & Interfaces
Abstract:Developing new functionalities of two-dimensional materials (2Dms) can be achieved by their chemical modification with a broad spectrum of molecules. This functionalization is commonly studied by using spectroscopies such as Raman, IR, or XPS, but the detection limit is a common problem. In addition, these methods lack detailed spatial resolution and cannot provide information about the homogeneity of the coating. Atomic force microscopy (AFM), on the other hand, allows the study of 2Dms on the...
materials science, multidisciplinary,nanoscience & nanotechnology
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