Scanning Probe Microscopies for Characterizations of 2D Materials

Shaoqiang Su,Jiong Zhao,Thuc Hue Ly
DOI: https://doi.org/10.1002/smtd.202400211
IF: 12.4
2024-05-22
Small Methods
Abstract:This review summarizes significant advancements and innovations in the developments in applying scanning probe microscopy (SPM) techniques to explore 2D materials. It highlights the capability of SPM to achieve the in situ measurements under various chemical conditions. Moreover, it outlines the challenges and potential opportunities for future exploration and application in the evolving area of SPM techniques. 2D materials are intriguing due to their remarkably thin and flat structure. This unique configuration allows the majority of their constituent atoms to be accessible on the surface, facilitating easier electron tunneling while generating weak surface forces. To decipher the subtle signals inherent in these materials, the application of techniques that offer atomic resolution (horizontal) and sub‐Angstrom (z‐height vertical) sensitivity is crucial. Scanning probe microscopy (SPM) emerges as the quintessential tool in this regard, owing to its atomic‐level spatial precision, ability to detect unitary charges, responsiveness to pico‐newton‐scale forces, and capability to discern pico‐ampere currents. Furthermore, the versatility of SPM to operate under varying environmental conditions, such as different temperatures and in the presence of various gases or liquids, opens up the possibility of studying the stability and reactivity of 2D materials in situ. The characteristic flatness, surface accessibility, ultra‐thinness, and weak signal strengths of 2D materials align perfectly with the capabilities of SPM technologies, enabling researchers to uncover the nuanced behaviors and properties of these advanced materials at the nanoscale and even the atomic scale.
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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