Graphene with scanning probe microscopy: A review

WANG Xiao-mu,XIAO Yu-bin,XU Jian-bin
DOI: https://doi.org/10.3969/j.issn.1000-6281.2012.01.015
2012-01-01
Abstract:In recent years,graphene has become an extremely hot topic in materials,electronic and nano-science research.For the unique two dimensional structure and smooth morphology in molecular scale of graphene which makes scanning probe microscopy(SPM) a dramatically strong tool to investigate graphene in a deep level.By using SPM,the surface properties of graphene such as electricity,mechanics and photology can be finely studied.Meanwhile,micro-fabrication in nano-level can also be achieved.In this article,the important role of SPM focused on characterization and processing in the investigation of graphene was fully summarized.In the mean time,the state-of-art evolution of graphene's surface research was presented in detail.Outlook of the potential function of SPM was given as well.
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