Exploring Coupled Extreme Environments via In-situ Transmission Electron Microscopy

Riley J. Parrish,Daniel C. Bufford,David M. Frazer,Caitlin A. Taylor,Jacob Gutierrez-Kolar,Daniel L. Buller,Brad L. Boyce,Khalid Hattar

DOI: https://doi.org/10.1017/s1551929520001595

2021-01-01

Microscopy Today

Abstract:Abstract

What problem does this paper attempt to address?

Possibility of an integrated transmission electron microscope: enabling complex in-situ experiments

Khalid Hattar,Katherine L. Jungjohann

DOI: https://doi.org/10.1007/s10853-020-05598-z

IF: 4.5

2021-01-03

Journal of Materials Science

Abstract:Abstract Multimodal in-situ experiments are the wave of the future, as this approach will permit multispectral data collection and analysis during real-time nanoscale observation. In contrast, the evolution of technique development in the electron microscopy field has generally trended toward specialization and subsequent bifurcation into more and more niche instruments, creating a challenge for reintegration and backward compatibility for in-situ experiments on state-of-the-art microscopes. We do not believe this to be a requirement in the field; therefore, we propose an adaptive instrument that is designed to allow nearly simultaneous collection of data from aberration-corrected transmission electron microscopy (TEM), probe-corrected scanning transmission electron microscopy, ultrafast TEM, and dynamic TEM with a flexible in-situ testing chamber, where the entire instrument can be modified as future technologies are developed. The value would be to obtain a holistic understanding of the underlying physics and chemistry of the process-structure–property relationships in materials exposed to controlled extreme environments. Such a tool would permit the ability to explore, in-situ, the active reaction mechanisms in a controlled manner emulating those of real-world applications with nanometer and nanosecond resolution. If such a powerful tool is developed, it has the potential to revolutionize our materials understanding of nanoscale mechanisms and transients. Graphical Abstract

materials science, multidisciplinary
Towards data-driven next-generation transmission electron microscopy

Steven R. Spurgeon,Colin Ophus,Lewys Jones,Amanda Petford-Long,Sergei V. Kalinin,Matthew J. Olszta,Rafal E. Dunin-Borkowski,Norman Salmon,Khalid Hattar,Wei-Chang D. Yang,Renu Sharma,Yingge Du,Ann Chiaramonti,Haimei Zheng,Edgar C. Buck,Libor Kovarik,R. Lee Penn,Dongsheng Li,Xin Zhang,Mitsuhiro Murayama,Mitra L. Taheri

DOI: https://doi.org/10.1038/s41563-020-00833-z

IF: 41.2

2020-10-26

Nature Materials

Abstract:Electron microscopy touches on nearly every aspect of modern life, underpinning materials development for quantum computing, energy and medicine. We discuss the open, highly integrated and data-driven microscopy architecture needed to realize transformative discoveries in the coming decade.

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter
Liquid phase transmission electron microscopy for imaging of nanoscale processes in solution

Utkur Mirsaidov,Joseph P. Patterson,Haimei ZhengGuest,Haimei Zheng

DOI: https://doi.org/10.1557/mrs.2020.222

IF: 5

2020-09-01

MRS Bulletin

Abstract:Abstract

materials science, multidisciplinary,physics, applied
Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Chang Liu,Chaojie Ma,Jinjing Xu,Ruixi Qiao,Huacong Sun,Xiaomin Li,Zhi Xu,Peng Gao,Enge Wang,Kaihui Liu,Xuedong Bai

DOI: https://doi.org/10.1063/5.0031115

IF: 1.6

2021-01-01

Review of Scientific Instruments

Abstract:Exploring the corresponding relation between structural and physical properties of materials at the atomic scale remains the fundamental problem in science. With the development of the aberration-corrected transmission electron microscopy (AC-TEM) and the ultrafast optical spectroscopy technique, sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution can be achieved, respectively. However, the attempt to combine both their advantages is still a great challenge. Here, we develop in situ optical spectroscopy with high temporal resolution in AC-TEM by utilizing a self-designed and manufactured TEM specimen holder, which has the capacity of sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution. The key and unique design of our apparatus is the use of the fiber bundle, which enables the delivery of focused pulse beams into TEM and collection of optical response simultaneously. The generated focused spot has a size less than 2 µm and can be scanned in plane with an area larger than 75 × 75 µm2. Most importantly, the positive group-velocity dispersion caused by glass fiber is compensated by a pair of diffraction gratings, thus resulting in the generation of pulse beams with a pulse width of about 300 fs (@ 3 mW) in TEM. The in situ experiment, observing the atomic structure of CdSe/ZnS quantum dots in AC-TEM and obtaining the photoluminescence lifetime (∼4.3 ns) in the meantime, has been realized. Further ultrafast optical spectroscopy with femtosecond-scale temporal resolution could be performed in TEM by utilizing this apparatus.
Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Alexander Pattison,Cassio C.S. Pedroso,Bruce E. Cohen,Justin C. Ondry,A. Paul Alivisatos,Wolfgang Theis,Peter Ercius

2023-08-01

Abstract:Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments.

Instrumentation and Detectors
Ultrafast Relativistic Electron Nanoprobes

F. Ji,D. B. Durham,A. M. Minor,P. Musumeci,J. G. Navarro,D. Filippetto

DOI: https://doi.org/10.1038/s42005-019-0154-4

2019-05-21

Communications Physics

Abstract:One of the frontiers in electron scattering is to couple ultrafast temporal resolution with highly localized probes to investigate the role of microstructure on material properties. Here, taking advantage of the high average brightness of our electron source, we demonstrate the generation of ultrafast relativistic electron beams with picometer-scale emittance and their ability to probe nanoscale features on materials with complex microstructures. The electron beam is tightly focused at the sample plane by a custom in-vacuum lens system, and its evolution around the waist is accurately reconstructed. We then use the focused beam to characterize a Ti-6 wt% Al polycrystalline sample by correlating the diffraction and imaging modality, showcasing the capability to locate grain boundaries and map adjacent crystallographic domains with sub-micron precision. This work provides a paradigm for ultrafast electron instrumentation, enabling characterization techniques such as relativistic ultrafast electron nano-diffraction and ultrafast scanning transmission electron microscopy.

physics, multidisciplinary
Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Trevor Clark,Caitlin A Taylor,Christopher M Barr,Khalid Hattar

DOI: https://doi.org/10.3791/61293

2022-06-27

Abstract:There is a need to understand materials exposed to overlapping extreme environments such as high temperature, radiation, or mechanical stress. When these stressors are combined there may be synergistic effects that enable unique microstructural evolution mechanisms to activate. Understanding of these mechanisms is necessary for the input and refinement of predictive models and critical for engineering of next generation materials. The basic physics and underlying mechanisms require advanced tools to be investigated. The in situ ion irradiation transmission electron microscope (I³TEM) is designed to explore these principles. To quantitatively probe the complex dynamic interactions in materials, careful preparation of samples and consideration of experimental design is required. Particular handling or preparation of samples can easily introduce damage or features that obfuscate the measurements. There is no one correct way to prepare a sample; however, many mistakes can be made. The most common errors and things to consider are highlighted within. The I³TEM has many adjustable variables and a large potential experimental space, therefore it is best to design experiments with a specific scientific question or questions in mind. Experiments have been performed on large number of sample geometries, material classes, and with many irradiation conditions. The following are a subset of examples that demonstrate unique in situ capabilities utilizing the I3TEM. Au nanoparticles prepared by drop casting have been used to investigate the effects of single ion strikes. Au thin films have been used in studies on the effects of multibeam irradiation on microstructure evolution. Zr films have been exposed to irradiation and mechanical tension to examine creep. Ag nanopillars were subjected to simultaneous high temperature, mechanical compression, and ion irradiation to study irradiation induced creep as well. These results impact fields including: structural materials, nuclear energy, energy storage, catalysis, and microelectronics in space environments.
Transmission electron microscopy (TEM) of Earth and planetary materials: A review

M. R. Lee

DOI: https://doi.org/10.1180/minmag.2010.074.1.1

2010-02-01

Mineralogical Magazine

Abstract:Abstract Using high intensity beams of fast electrons, the transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) enable comprehensive characterization of rocks and minerals at micrometre to sub-nanometre scales. This review outlines the ways in which samples of Earth and planetary materials can be rendered sufficiently thin for TEM and STEM work, and highlights the significant advances in site-specific preparation enabled by the focused ion beam (FIB) technique. Descriptions of the various modes of TEM and STEM imaging, electron diffraction and X-ray and electron spectroscopy are outlined, with an emphasis on new technologies that are of particular relevance to geoscientists. These include atomic-resolution Z-contrast imaging by high-angle annular dark-field STEM, electron crystallography by precession electron diffraction, spectrum mapping using X-rays and electrons, chemical imaging by energy-filtered TEM and true atomic-resolution imaging with the new generation of aberration-corrected microscopes. Despite the sophistication of modern instruments, the spatial resolution of imaging, diffraction and X-ray and electron spectroscopy work on many natural materials is likely to remain limited by structural and chemical damage to the thin samples during TEM and STEM.

mineralogy
In Situ High Temperature Atomic Resolution Transmission Electron Microscopy of 2D Nanomaterials

ashley gibb,nasim alem,jianhao chen,jim ciston,alex zettl

DOI: https://doi.org/10.1017/S1431927614010587

IF: 4.0991

2014-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Stephen J. Pennycook,Changjian Li,Mengsha Li,Chunhua Tang,Eiji Okunishi,Maria Varela,Young-Min Kim,Jae Hyuck Jang

DOI: https://doi.org/10.1186/s40543-018-0142-4

2019-08-20

Abstract:Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as low as 40 kV, allowing knock-on damage to be minimized in beam sensitive materials. The aberration-corrected probes can contain sufficient current for high quality, simultaneous, imaging and analysis in multiple modes. Atomic positions can be mapped with picometer precision, revealing ferroelectric domain structures, composition can be mapped by energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS) and charge transfer can be tracked unit cell by unit cell using the EELS fine structure. Furthermore, dynamics of point defects can be investigated through rapid acquisition of multiple image scans. Today STEM has become an indispensable tool for analytical science at the atomic level, providing a whole new level of insights into the complex interplays that control materials properties.

Materials Science
Mapping Structural Heterogeneity at the Nanoscale with Scanning Nano-structure Electron Microscopy (SNEM)

Yevgeny Rakita,James L. Hart,Partha Pratim Das,Daniel L. Foley,Stavros Nicolopoulos,Sina Shahrezaei,Suveen Nigel Mathaudhu,Mitra L. Taheri,Simon J. L. Billinge

DOI: https://doi.org/10.1016/j.actamat.2022.118426

2022-08-26

Abstract:Here we explore the use of scanning electron diffraction coupled with electron atomic pair distribution function analysis (ePDF) to understand the local order as a function of position in a complex multicomponent system, a hot rolled, Ni-encapsulated, Zr$_{65}$Cu$_{17.5}$Ni$_{10}$Al$_{7.5}$ bulk metallic glass (BMG), with a spatial resolution of 3 nm. We show that it is possible to gain insight into the chemistry and chemical clustering/ordering tendency in different regions of the sample, including in the vicinity of nano-scale crystallites that are identified from virtual dark field images and in heavily deformed regions at the edge of the BMG. In addition to simpler analysis, unsupervised machine learning was used to extract partial PDFs from the material, modeled as a quasi-binary alloy, and map them in space. These maps allowed key insights not only into the local average composition, as validated by EELS, but also a unique insight into chemical short-range ordering tendencies in different regions of the sample during formation. The experiments are straightforward and rapid and, unlike spectroscopic measurements, don't require energy filters on the instrument. We spatially map different quantities of interest (QoI's), defined as scalars that can be computed directly from positions and widths of ePDF peaks or parameters refined from fits to the patterns. We developed a flexible and rapid data reduction and analysis software framework that allows experimenters to rapidly explore images of the sample on the basis of different QoI's. The power and flexibility of this approach are explored and described in detail. Because of the fact that we are getting spatially resolved images of the nanoscale structure obtained from ePDFs we call this approach scanning nano-structure electron microscopy (SNEM), and we believe that it will be powerful and useful extension of current 4D-STEM methods.

Materials Science,Disordered Systems and Neural Networks
In Situ and Emerging Transmission Electron Microscopy for Catalysis Research

Hsin-Yun Chao,Kartik Venkatraman,Saman Moniri,Yongjun Jiang,Xuan Tang,Sheng Dai,Wenpei Gao,Jianwei Miao,Miaofang Chi

DOI: https://doi.org/10.1021/acs.chemrev.2c00880

IF: 62.1

2023-06-17

Chemical Reviews

Abstract:Catalysts are the primary facilitator in many dynamic processes. Therefore, a thorough understanding of these processes has vast implications for a myriad of energy systems. The scanning/transmission electron microscope (S/TEM) is a powerful tool not only for atomic-scale characterization but also in situ catalytic experimentation. Techniques such as liquid and gas phase electron microscopy allow the observation of catalysts in an environment conducive to catalytic reactions. Correlated...

chemistry, multidisciplinary
Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope.

J S Wu,A M Kim,R Bleher,B D Myers,R G Marvin,H Inada,K Nakamura,X F Zhang,E Roth,S Y Li,T K Woodruff,T V O'Halloran,Vinayak P Dravid

DOI: https://doi.org/10.1016/j.ultramic.2013.01.004

IF: 2.994

2013-01-01

Ultramicroscopy

Abstract:A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems.
Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains.

A. Mikkelsen,J. Schwenke,T. Fordell,G. Luo,K. Klunder,E. Hilner,N. Anttu,A. A. Zakharov,E. Lundgren,J. Mauritsson,J. N. Andersen,H. Q. Xu,A. L'Huillier

DOI: https://doi.org/10.1063/1.3263759

IF: 1.6

2009-01-01

Review of Scientific Instruments

Abstract:We report the first experiments carried out on a new imaging setup, which combines the high spatial resolution of a photoemission electron microscope (PEEM) with the temporal resolution of extreme ultraviolet (XUV) attosecond pulse trains. The very short pulses were provided by high-harmonic generation and used to illuminate lithographic structures and Au nanoparticles, which, in turn, were imaged with a PEEM resolving features below 300 nm. We argue that the spatial resolution is limited by the lack of electron energy filtering in this particular demonstration experiment. Problems with extensive space charge effects, which can occur due to the low probe pulse repetition rate and extremely short duration, are solved by reducing peak intensity while maintaining a sufficient average intensity to allow imaging. Finally, a powerful femtosecond infrared (IR) beam was combined with the XUV beam in a pump-probe setup where delays could be varied from subfemtoseconds to picoseconds. The IR pump beam could induce multiphoton electron emission in resonant features on the surface. The interaction between the electrons emitted by the pump and probe pulses could be observed. (C) 2009 American Institute of Physics. [doi:10.1063/1.3263759]
Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Josh Kacher,Yao Xie,Sven P. Voigt,Shixiang Zhu,Henry Yuchi,Jordan Key,Surya R. Kalidindi

DOI: https://doi.org/10.48550/arXiv.2104.08688

2021-08-21

Abstract:Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.

Computer Vision and Pattern Recognition
Spatial–temporal characterization of photoemission in a streak-mode dynamic transmission electron microscope

Samik Roy Moulik,Yingming Lai,Aida Amini,Patrick Soucy,Kenneth R. Beyerlein,Jinyang Liang

DOI: https://doi.org/10.1063/4.0000219

2024-01-01

Structural Dynamics

Abstract:A long-standing motivation driving high-speed electron microscopy development is to capture phase transformations and material dynamics in real time with high spatial and temporal resolution. Current dynamic transmission electron microscopes (DTEMs) are limited to nanosecond temporal resolution and the ability to capture only a few frames of a transient event. With the motivation to overcome these limitations, we present our progress in developing a streak-mode DTEM (SM-DTEM) and demonstrate the recovery of picosecond images with high frame sequence depth. We first demonstrate that a zero-dimensional (0D) SM-DTEM can provide temporal information on any local region of interest with a 0.37 μm diameter, a 20-GHz sampling rate, and 1200 data points in the recorded trace. We use this method to characterize the temporal profile of the photoemitted electron pulse, finding that it deviates from the incident ultraviolet laser pulse and contains an unexpected peak near its onset. Then, we demonstrate a two-dimensional (2D) SM-DTEM, which uses compressed-sensing-based tomographic imaging to recover a full spatiotemporal photoemission profile over a 1.85-μm-diameter field of view with nanoscale spatial resolution, 370-ps inter-frame interval, and 140-frame sequence depth in a 50-ns time window. Finally, a perspective is given on the instrumental modifications necessary to further develop this promising technique with the goal of decreasing the time to capture a 2D SM-DTEM dataset.

physics, atomic, molecular & chemical,chemistry, physical
Visualizing the ultra-structure of microorganisms using table-top extreme ultraviolet imaging

Chang Liu,Wilhelm Eschen,Lars Loetgering,Daniel S. Molina,Robert Klas,Alexander Iliou,Michael Steinert,Sebastian Herkersdorf,Alexander Kirsche,Thomas Pertsch,Falk Hillmann,Jens Limpert,Jan Rothhardt

DOI: https://doi.org/10.1186/s43074-023-00084-6

2022-11-08

Abstract:Table-top extreme ultraviolet (EUV) microscopy offers unique opportunities for label-free investigation of biological samples. Here, we demonstrate ptychographic EUV imaging of two dried, unstained model specimens: germlings of a fungus (Aspergillus nidulans), and bacteria (Escherichia coli) cells at 13.5 nm wavelength. We find that the EUV spectral region, which to date has not received much attention for biological imaging, offers sufficient penetration depths for the identification of intracellular features. By implementing a position-correlated ptychography approach, we demonstrate a millimeter-squared field of view enabled by infrared illumination combined with sub-60 nm spatial resolution achieved with EUV illumination on selected regions of interest. The strong element contrast at 13.5 nm wavelength enables the identification of the nanoscale material composition inside the specimens. Our work will advance and facilitate EUV imaging applications and enable further possibilities in life science.

Biological Physics,Optics
An $\textit{In Situ}$ Light Illumination System for an Aberration-Corrected Environmental Transmission Electron Microscope

Qianlang Liu,Barnaby D. A. Levin,Diane M. Haiber,Joshua L. Vincent,Peter A. Crozier

DOI: https://doi.org/10.48550/arXiv.2104.02006

2021-05-19

Abstract:In this work, an optic fiber based $\textit{in situ}$ illumination system integrated into an aberration-corrected environmental transmission electron microscope (ETEM) is designed, built, characterized and applied. With this illumination system, the dynamic responses of photoactive materials to photons can be directly observed at the atomic level, and other stimuli including heating and various gases can also be applied simultaneously. Either a broadband light source or a high power laser source aiming to expedite photoreactions can be utilized, fitting different application needs. The optic fiber enters the ETEM through the objective aperture port, with a carefully designed curvature and a 30° cut at the tip to orient the emitted light upwards onto the TEM specimen. The intensity distributions striking the sample from the broadband and laser sources are both measured, and due to the non-uniform distributions, an alignment procedure has been developed to align the bright spot with the electron optical axis of the TEM. The imaging and spectroscopy performances of the ETEM are proved to be maintained after incorporating this illumination system. Furthermore, Langmuir evaporation is observed when in situ laser light is applied to GaAs, demonstrating the phenomenon of optical heating on suitable semiconductor materials.

Materials Science
Single shot ultrafast electron microscopy

Renkai Li,Pietro Musumeci

2013-01-01

Abstract:Page 1. Single-shot Ultrafast Electron Microscopy Renkai Li and Pietro Musumeci Department of Physics and Astronomy, UCLA 25th North American Particle Accelerator Conference Sep 30 - Oct 4, 2013, Pasadena, CA, USA Page 2. Outline • transmission electron microscopes go '4D' • stroboscopic and single-shot approaches • single-shot, picosecond-temporal resolution UEM based on photocathode rf guns – ultralow emittance: cigar-shape beam – ultralow energy spread: rf curvature regulation – novel electron optics: PMQ and μ-quads • summary and outlook 2 Page 3. Transmission electron microscopies 3 DA Muller, Nat. Mater. 8, 263 (2009) Adapted from HH Rose (2009) ❖ primary tool for material science, chemistry, physics, biology, and industry ❖ sub-Ångström spatial resolution with aberration correction Ruska's EM sketch TEAM I at NCEM LBNL 3D electron tomography at ångström resolution …
Transmission Electron Microscopy at Atmospheric Pressure

Xiaoqing Pan,Shuyi Zhang,Sheng Dai,George W. Graham

DOI: https://doi.org/10.1017/s1431927616004487

IF: 4.0991

2016-01-01

Microscopy and Microanalysis

Abstract:An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Exploring Coupled Extreme Environments via In-situ Transmission Electron Microscopy

Possibility of an integrated transmission electron microscope: enabling complex in-situ experiments

Towards data-driven next-generation transmission electron microscopy

Liquid phase transmission electron microscopy for imaging of nanoscale processes in solution

Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Ultrafast Relativistic Electron Nanoprobes

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Transmission electron microscopy (TEM) of Earth and planetary materials: A review

In Situ High Temperature Atomic Resolution Transmission Electron Microscopy of 2D Nanomaterials

Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Mapping Structural Heterogeneity at the Nanoscale with Scanning Nano-structure Electron Microscopy (SNEM)

In Situ and Emerging Transmission Electron Microscopy for Catalysis Research

Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope.

Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains.

Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Spatial–temporal characterization of photoemission in a streak-mode dynamic transmission electron microscope

Visualizing the ultra-structure of microorganisms using table-top extreme ultraviolet imaging

An $\textit{In Situ}$ Light Illumination System for an Aberration-Corrected Environmental Transmission Electron Microscope

Single shot ultrafast electron microscopy

Transmission Electron Microscopy at Atmospheric Pressure