Multispectral radiation temperature data processing algorithm for high temperature complex material surface

Shan Gao,Zhiwei Chen,Hailong Liu,Yue Han,Liwei Chen,Ying Cui,Tong Wang,Zezhan Zhang,Jing Jiang,Yi Niu,Chao Wang
DOI: https://doi.org/10.1016/j.optlastec.2024.111866
IF: 4.939
2024-10-10
Optics & Laser Technology
Abstract:As a method to monitor the condition of complex super-characteristic materials, non-contact temperature measurement has been widely used in extreme environment measurement, but its temperature measurement results are greatly affected by the surface emissivity of complex materials. The characteristic trend of surface emissivity of complex materials is often uncertain and difficult to calculate directly due to many factors. In this paper, we propose a temperature measurement method for complex material surface multi-spectral data processing for simultaneous computational inversion of emissivity and temperature of complex materials. The inversion results show that the method can solve the problem of unknown surface emissivity of complex materials, and the temperature inversion error is less than 1%, which is expected to be applied to temperature monitoring in extreme environment for complex materials.
optics,physics, applied
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