Spectroscopic and electrical properties of polymer nanocomposite films based on PMMA/PVDF incorporated with silicon oxide (SiO2) for promising electronic devices

S. K. Algamdi,N. M. Basfer,Wafaa Al-Ghamdi
DOI: https://doi.org/10.1007/s11082-024-06300-2
IF: 3
2024-02-07
Optical and Quantum Electronics
Abstract:Polymer nanocomposites consisting of polymethyl methacrylate/polyvinylidene fluoride (PMMA/PVDF) polymer doped with silicon oxide (SiO 2 ) nanopowders were prepared using solvothermal. The XRD and FT-IR measurements confirmed the chances of the structure of the PMMA/PVDF blend due to the addition of SiO 2 . The IR intensity and XRD structural changes affirmed the miscibility and complexation between the pure blend PMMA/PVDF and the blend with SiO 2 NPs as a filler. The addition of SiO 2 causes a decrease and weakening of the intensity of the diffraction peaks of PMMA/PVDF indicating that the addition can gradually reduce the crystallinity of the composite films. The changes in the structural and optical properties caused a shift in the absorption edge toward a lower wavelength, which resulted in a drop in the energy gap value. The dielectric constant (ε′), dielectric loss (ε′′), the dielectric moduli (M′ and M′′), and the AC conductivity (σ ac ) were measured in the range of frequency from 0.1 to 10 6 Hz. Increasing of the frequency resulted in lower estimates for both ε′ and ε′′. A charge-transfer complex was formed when SiO 2 NPs were incorporated into the PMMA/PVDF blend. The Cole–Cole plot, obtained using a non-Debye technique, exhibited a semicircular shape when plotting the values of M′ and M′′.
engineering, electrical & electronic,optics,quantum science & technology
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