Abstract:The evolution from classical to quantum matter wave optics has been influenced by transformative optical devices. Fresnel zone plates (FZP), initially designed for light manipulation, have now found expanded applications in matter waves. In this study, focusing of helium atoms by an electrically biased FZP is investigated numerically. The $n$th opaque zone of the FZP is subject to electrostatic biasing using three ways: (i) $V_n=V_1$, where $V_1$ is the biasing voltage applied to the central zone, (ii) $V_n=V_1 \sqrt{n}$, and (iii) $V_n = V_1 \sin (k_E n)$, with $k_E$ being the radial modulation factor. The effect of biasing the FZP on the transmission coefficient ($T_c$), focal length ($f$), size of the focused wave packet ($\sigma_F$), transverse intensity profile, and focusing efficiency ($\eta$) is investigated. The study reveals that the electrical biasing of the FZP modulates the diffractive focusing of neutral atoms by altering the atom-surface interaction with induced polarization potential. It is observed that biasing with $V_n=V_1$ induces multi-focusing of the FZP, reducing wave packet transmission and focusing efficiency. Biasing with $V_n=V_1 \sqrt{n}$ significantly enhances the transmission coefficient by $23.7\%$, increases the focal length $f$ by $103\%$, and improves the focusing efficiency from $10\%$ to $20.17\%$, indicating enhanced focusing performance. Biasing with $V_n=V_1 \sin(k_E n)$ offers increased controllability in focusing matter waves through the parameters $k_E$ and $V_1$. In this case, a highly intense focused wave packet with a better efficiency of $20.3\%$ is observed compared to the other cases. The findings will be helpful in various emerging applications of atom optics, such as improving the performance of helium microscopes, enabling control in cold atom trapping on atom chips, and high-precision atom lithography for quantum electronic devices.

Imaging and focusing of atoms by a fresnel zone plate

Formation of Sub-Half-Wavelength Focal Spot with Ultra Long Depth of Focus

Electrically controlled focusing of de Broglie matter waves by Fresnel zone plate

Reflection imaging with a helium zone plate microscope

Optical characterisation of micro-fabricated Fresnel zone plates for atomic waveguides

Ion beam lithography for Fresnel zone plates in X-ray microscopy

Performance Test of Fresnel Zone Plate with 50 nm Outermost Zone Width in Hard X-ray Region

Wavelength-scale imaging of trapped ions using a phase Fresnel lens

Electromagnetic Exploration of Focusing Properties of High-Numerical-aperture Micro-Fresnel Zone Plates

Interlaced zone plate optics for hard X-ray imaging in the 10 nm range

Dual‐Wavelength Focusing Through Fresnel Zone Plate Fabricated in Lithium Niobate Crystal by Femtosecond Laser Micromachining

Experimental Verification of the Super-Resolution Focusing Optical Needle and Imaging with a New Type Fresnel Zone Plate

X-ray Imaging Fresnel Zone Plates and Fabrication

Millimeter-wave Fresnel-zone plate lens and antenna

Three-dimensional imaging of single atoms in an optical lattice via helical point-spread-function engineering

Fabrication of Fresnel zone plates with high aspect ratio by soft X-ray lithography

Simulation of an X-ray Fresnel Zone Plate with Nonideal Factors

Plasmonic Microzone Plate: Superfocusing at Visible Regime

Fabrication of X-ray Imaging Zone Plates by E-Beam and X-ray Lithography

Axial Intensity Distribution of a Micro-Fresnel Zone Plate at an Arbitrary Numerical Aperture