Highly Stable HfO 2 Memristors through van der Waals Electrode Lamination and Delamination

Wei Tong,Wei Wei,Xiangzhe Zhang,Shuimei Ding,Zheyi Lu,Liting Liu,Wanying Li,Chen Pan,Lingan Kong,Yiliu Wang,Mengjian Zhu,Shi-Jun Liang,Feng Miao,Yuan Liu
DOI: https://doi.org/10.1021/acs.nanolett.3c02888
IF: 10.8
2023-10-21
Nano Letters
Abstract:Memristors have attracted considerable attention in the past decade, holding great promise for future neuromorphic computing. However, the intrinsic poor stability and large device variability remain key limitations for practical application. Here, we report a simple method to directly visualize the origin of poor stability. By mechanically removing the top electrodes of memristors operated at different states (such as SET or RESET), the memristive layer could be exposed and directly...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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