Finite element model verification for packaged printed circuit board by experimental modal analysis

Ying-Chih Lee,Bor-Tsuen Wang,Yi-Shao Lai,Chang-Lin Yeh,Rong-Sheng Chen
DOI: https://doi.org/10.1016/j.microrel.2008.07.068
IF: 1.6
2008-11-01
Microelectronics Reliability
Abstract:In this work, the experimental modal analysis (EMA) was performed to establish an equivalent finite element (FE) model for a standard Joint Electron Device Engineering Council (JEDEC) drop test printed circuit board (PCB) mounted with packages in a full array. Material properties of the equivalent FE model of the packaged PCB were calibrated through an optimization process with respect to natural frequencies based on EMA results obtained with a free boundary condition. The model was then applied to determine screwing tightness of the packaged PCB corresponding to a fixed boundary condition with the four corners of the PCB constrained, as defined by JEDEC for a board-level drop test. Modal damping ratios of the packaged PCB were also provided.
engineering, electrical & electronic,nanoscience & nanotechnology,physics, applied
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