Layer-dependent Raman spectroscopy of ultrathin

Zhenyu Sun,Zhaopeng Guo,Dayu Yan,Peng Cheng,Lan Chen,Youguo Shi,Yuan Huang,Zhijun Wang,Kehui Wu,Baojie Feng
DOI: https://doi.org/10.1103/physrevmaterials.7.094004
IF: 3.98
2023-09-15
Physical Review Materials
Abstract:Two-dimensional topological insulators (2DTIs) or quantum spin Hall insulators are attracting increasing attention due to their potential applications in next-generation spintronic devices. Despite their promising prospects, realizable 2DTIs are still limited. Recently, Ta2Pd3Te5 , a semiconducting van der Waals material, has shown spectroscopic evidence of quantum spin Hall states. However, achieving controlled preparation of few to monolayer samples, a crucial step in realizing quantum spin Hall devices, has not yet been achieved. In this work, we fabricated few to monolayer Ta2Pd3Te5 and performed systematic thickness- and temperature-dependent Raman spectroscopy measurements. Our results demonstrate that Raman spectra can provide valuable information to determine the thickness of Ta2Pd3Te5 thin flakes. Moreover, our angle-resolved polarized Raman (ARPR) spectroscopy measurements show that the intensities of the Raman peaks are strongly anisotropic due to the quasi-one-dimensional atomic structure, providing a straightforward method to determine its crystalline orientation. Our findings may stimulate further efforts to realize quantum devices based on few or monolayer Ta2Pd3Te5 . https://doi.org/10.1103/PhysRevMaterials.7.094004 ©2023 American Physical Society
materials science, multidisciplinary
What problem does this paper attempt to address?